249 results on '"George J. Papaioannou"'
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2. Electrical properties of SiNx films with embedded CNTs for MEMS capacitive switches.
3. Temperature accelerated discharging processes through the bulk of PECVD silicon nitride films for MEMS capacitive switches.
4. Modelling of the dynamical behaviour of floating electrode MEMS.
5. An in depth analysis of pull-up capacitance-voltage characteristic for dielectric charging assessment of MEMS capacitive switches.
6. Dielectric charging phenomena in diamond films used in RF MEMS capacitive switches: The effect of film thickness.
7. Induced charging phenomena on SiNx dielectric films used in RF MEMS capacitive switches.
8. Dielectric charging effects in floating electrode MEMS capacitive switches.
9. A study of deposition conditions on charging properties of PECVD silicon nitride films for MEMS capacitive switches.
10. Properties of contactless and contacted charging in MEMS capacitive switches.
11. A temperature study of photosensitivity in SLS polycrystalline silicon TFTs.
12. Temperature effects on the bulk discharge current of dielectric films of MEMS capacitive switches.
13. A study of field emission process in electrostatically actuated MEMS switches.
14. On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies.
15. Determination of bulk discharge current in the dielectric film of MEMS capacitive switches.
16. Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques.
17. Degradation of polycrystalline silicon TFTs due to alpha particles irradiation stress.
18. Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs.
19. Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions.
20. Accelerated lifetime test of RF-MEMS switches under ESD stress.
21. On the Discharge Transport Mechanisms Through the Dielectric Film in MEMS Capacitive Switches
22. Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique.
23. Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation.
24. Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches.
25. Alpha particle radiation effects in RF MEMS capacitive switches.
26. ESD failure signature in capacitive RF MEMS switches.
27. Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques.
28. Structure dependent charging process in RF MEMS capacitive switches.
29. An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors.
30. Charging of radiation induced defects in RF MEMS dielectric films.
31. Investigation of charging mechanisms in metal-insulator-metal structures.
32. The impact of static and dynamic degradation on SOI 'smart-cut' floating body MOSFETs.
33. Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors.
34. On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs.
35. Deep Sequencing Identified Dysregulated Circulating MicroRNAs in Late Onset Preeclampsia
36. Functionalized Zinc Porphyrins with Various Peripheral Groups for Interfacial Electron Injection Barrier Control in Organic Light Emitting Diodes
37. Engineering of Porphyrin Molecules for Use as Effective Cathode Interfacial Modifiers in Organic Solar Cells of Enhanced Efficiency and Stability
38. ASPRE trial: incidence of preterm pre-eclampsia in patients fulfilling ACOG and NICE criteria according to risk by FMF algorithm
39. An internally validated prediction model for critical COVID-19 infection and intensive care unit admission in symptomatic pregnant women
40. A novel method for the assessment of surface charge density variance in capacitive RF-MEMS switches
41. ASPRE Trial: Incidence of Preterm Preeclampsia in Patients Fulfilling ACOG and NICE Criteria According to Risk by FMF Algorithm
42. Dielectric Charging Asymmetry in SiN Films Used in RF MEMS Capacitive Switches
43. Erratum to 'On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies' [MR 51/9-11 (2011) 1810-1818].
44. Conduction mechanisms in conductive multi-walled carbon nanotube filled polydimethylsiloxane nanocomposites
45. Assessment of dielectric charging in capacitive MEMS switches fabricated on Si substrate with thin oxide film
46. Editorial of 31st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2020)
47. Field emission induced-damage in the actuation paths of MEMS capacitive structures
48. A study of hopping transport during discharging in SiNx films for MEMS capacitive switches
49. A study of material stoichiometry on charging properties of SiNx films for potential application in RF MEMS capacitive switches
50. Mitigation of Dielectric Charging in MEMS Capacitive Switches with Stacked TiO2/Y2O3 Insulator Film
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