99 results on '"Hatzopoulos, Alkis A."'
Search Results
2. The Evolution from Design to Verification of the Antenna System and Mechanisms in the AcubeSAT mission
3. SMART Integrated Circuit Design and Methodology
4. Introduction
5. Introduction
6. Heterogeneous Cyber Physical Systems of Systems
7. A Low-Cost, Robust and Tolerant, Digital Scheme for Post-Bond Testing and Diagnosis of TSVs
8. Mismatch Driven Systematic Design Methodology for Transistor Based Active Resistors
9. A novel wide frequency range 65nm CMOS VCO
10. Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements
11. A low power low noise 65nm charge pump using mismatch compensation and smoothing capacitor
12. Exact closed-form expressions for substrate resistance and capacitance extraction in nanoscale VLSI
13. Closed-form expressions for the coupling capacitance of metal fill tiles in VLSI circuits
14. A 0.5–20 GHz bandwidth enhanced distributed amplifier
15. An evolutionary method for efficient computation of mutual capacitance for VLSI circuits based on the method of images
16. Investigation and Simulation of Hardware Errors in Kernel Logs of Linux-based Server Systems
17. Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring
18. De-embedding method for on-wafer RF CMOS inductor measurements
19. An improved optical feedback pixel driver circuit
20. A unified procedure for fault detection of analog mixed-mode circuits using magnitude and phase components of the power supply current spectrum
21. Resolving differences of parameter extraction methods for integrated inductor design and model validation
22. High performance, wide tuning range 65nm CMOS tunable Voltage Controlled Ring Oscillator up to 11 GHz
23. An Alternative Post-bond Testing Method for TSVs
24. Correlation-based comparison of analog signatures for identification and fault diagnosis
25. A complete scheme of built-in self-test (BIST) structure for fault diagnosis in analog circuits and systems
26. Embedded toggle generator to provide realistic test conditions during test of digital 2D-SoCs and 3D-SICs
27. Improved transmission line model for high-frequency modelling of through silicon vias
28. On-Chip Toggle Generators to Provide Realistic Conditions during Test of Digital 2D-SoCs and 3D-SICs
29. Architecture and procedures for pH and temperature monitoring in medical applications
30. Oscillation-based technique for post-bond parallel testing and diagnosis of multiple TSVs
31. Embedded toggle generator to control the switching activity during test of digital 2D-SoCs and 3D-SICs
32. Analog circuit testing
33. Oscillation-based technique for TSV post-bond test considerations
34. Toward Silicon-Based Cognitive Neuromorphic ICs—A Survey
35. Interconnection coupling on lightly doped substrate for millimeter wave frequencies
36. Fault modeling and testing of through silicon via interconnections
37. Modeling the Coupling through Substrate for Frequencies up to 100GHz
38. SSCS DL Francesco Svelto Visits Circuit Designers in Athens and Thessaloniki: Twin Programs Organized by SSCS-Greece [Chapters]
39. Modeling of partially cracked and void hole defected through silicon via interconnections
40. Substrate coupling noise considerations for frequencies up to 100GHz
41. Modeling and analysis of cracked through silicon via (TSV) interconnections
42. A 0.5–20GHz bandwidth enhanced distributed amplifier
43. Prospects of 3D inductors on through silicon vias processes for 3D ICs
44. Efficient inductance calculation for long and medium length rectangular interconnects in VLSI circuits
45. A wideband and SPICE-compatible model for interconnect coupling prediction in nanoscale VLSI circuits up to 60 GHz
46. A memetic algorithm for computing 3D capacitance in multiconductor VLSI circuits
47. Exact closed-form expressions for substrate resistance and capacitance extraction in nanoscale VLSI
48. A GA-based method for efficient interconnect capacitance computation in mixed-signal integrated circuits using sets of linear charges
49. Efficient testing of an optical feedback pixel driver using wavelet analysis
50. Circuit Implementation of a Supply Current Spectrum Test Method
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.