9 results on '"Healey, Jerry T."'
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2. Resolving localized oxide breakthrough during poly etch of nonvolatile floating gate structures
3. Role of RIE in microchip bond pad corrosion
4. Prevention of auto-doping-induced threshold voltage shifts
5. Reduction of low-level current leakage in CMOS devices
6. Resolving localized oxide breakthrough during poly etch of nonvolatile floating gate structures.
7. Influence of topographical variations on reliable via and contact formation.
8. Prevention of auto-doping-induced threshold voltage shifts.
9. Reduction of low-level current leakage in CMOS devices.
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