1. Imaging junctions of waveguides
- Author
-
Arnaud Recoquillay, Jean-François Fritsch, Laurent Bourgeois, Propagation des Ondes : Étude Mathématique et Simulation (POEMS), Inria Saclay - Ile de France, Institut National de Recherche en Informatique et en Automatique (Inria)-Institut National de Recherche en Informatique et en Automatique (Inria)-Unité de Mathématiques Appliquées (UMA), École Nationale Supérieure de Techniques Avancées (ENSTA Paris)-École Nationale Supérieure de Techniques Avancées (ENSTA Paris)-Centre National de la Recherche Scientifique (CNRS), and Commissariat à l'énergie atomique et aux énergies alternatives (CEA)
- Subjects
Physics ,Control and Optimization ,business.industry ,Physics::Optics ,010502 geochemistry & geophysics ,01 natural sciences ,law.invention ,Complex geometry ,Optics ,law ,Modeling and Simulation ,0103 physical sciences ,Inverse scattering problem ,Fundamental solution ,Discrete Mathematics and Combinatorics ,[MATH.MATH-AP]Mathematics [math]/Analysis of PDEs [math.AP] ,Pharmacology (medical) ,[MATH]Mathematics [math] ,business ,010301 acoustics ,Waveguide ,Nonlinear Sciences::Pattern Formation and Solitons ,Analysis ,0105 earth and related environmental sciences - Abstract
International audience; In this paper we address the identification of defects by the Linear Sampling Method in half-waveguides which are related to each other by junctions. Firstly a waveguide which is characterized by an abrupt change of properties is considered, secondly the more difficult case of several half-waveguides related to each other by a junction of complex geometry. Our approach is illustrated by some two-dimensional numerical experiments.
- Published
- 2021