1. In situ through-thickness analysis of crack tip fields with synchrotron X-ray diffraction.
- Author
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Lopez-Crespo, P., Peralta, J.V., Kelleher, J.F., and Withers, P.J.
- Subjects
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FRESNEL diffraction , *X-ray diffraction , *SYNCHROTRONS , *BAINITIC steel , *LINEAR elastic fracture mechanics , *FATIGUE cracks - Abstract
• This work describes a novel hybrid methodology to extract essential information from the bulk of opaque materials. • It is based on a combination of experimental synchrotron X-ray diffraction data with a Westergaard's analytical model describing the crack tip fields. • Unlike most other full-field experimental techniques, this work is aimed at estimating the stress intensity factor in the bulk of the material in situ , thus being a great step forward in the understanding of the 3D nature of fatigue crack propagation. • The work is also pioneering in performing a parametric study of key factors that influence through thickness estimation of the stress intensity factor. In this work a novel approach to estimate in situ the stress intensity factor (SIF) through the thickness of metal specimens is presented. It is based on a hybrid methodology that combines powerful synchrotron X-ray diffraction data with an elastic analytical model describing the strain field around the crack tip. A sensitivity analysis is conducted to understand the largest sources of error and their impact on the estimated SIF values. The accuracy in locating the crack tip position was found to affect the quality of the SIF estimation. Accordingly a procedure is developed to help locate the crack tip position. The methodology is tested on ultra-fine grained aluminium alloy 5091 and on a bainitic steel. It is recommended that an area of interest having a size at least 3 times larger than the plane strain plastic zone is mapped, providing good SIF estimations (within 8%) for all cases studied. [ABSTRACT FROM AUTHOR]
- Published
- 2019
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