12 results on '"Quader, K.N."'
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2. A new approach for simulation of circuit degradation due to hot-electron damage in NMOSFETs.
3. Projecting CMOS circuit hot-carrier reliability from DC device lifetime.
4. Hot-carrier-reliability of mixed analog/digital technologies.
5. Simulations of CMOS circuit degradation due to hot-carrier effects.
6. A 286 mm/sup 2/ 256 Mb DRAM with /spl times/32 both-ends DQ.
7. Hot-carrier-reliability design guidelines for CMOS logic circuits.
8. A high-performance CMOS 70-MHz palette/DAC.
9. Hot-carrier-reliability design rules for translating device degradation to CMOS digital circuit degradation.
10. A bidirectional NMOSFET current reduction model for simulation of hot-carrier-induced circuit degradation.
11. The effects of hot-electron degradation on analog MOSFET performance
12. Hot-carrier reliability design guidelines for CMOS logic circuits.
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