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1. A Fully Integrated Ferroelectric Thin‐Film‐Transistor – Influence of Device Scaling on Threshold Voltage Compensation in Displays

Author

Michael P. M. Jank, Norbert Hanisch, Varvara Brackmann, Tarek Ali, Shawn Sanctis, Martin Ellinger, Konrad Seidel, Songrui Li, Matthias Rudolph, Thomas Kampfe, Konstantin Mertens, David Lehninger, Kati Biedermann, Maximilian Lederer, and Ricardo Olivio

Subjects
Materials science, business.industry, Transistor, Electronic, Optical and Magnetic Materials, Compensation (engineering), law.invention, Threshold voltage, Neuromorphic engineering, Thin-film transistor, law, Ferroelectric thin films, Optoelectronics, business, Scaling
Published
2021
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