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1. Magnetoresistance and spintronic anisotropy induced by spin excitations along molecular spin chains

3. Spin-driven electrical power generation at room temperature

4. Hole transport across MgO-based magnetic tunnel junctions with high resistance-area product due to oxygen vacancies

5. Backside Power Delivery With Relaxed Overlay for Backside Patterning Using Extreme Wafer Thinning and Molybdenum-Filled Slit Nano Through Silicon Vias

6. Control of defect-mediated tunneling barrier heights in ultrathin MgO films

9. Multimessenger Characterization of Markarian 501 during Historically Low X-Ray and $γ$-Ray Activity

10. Power, Performance, Area and Thermal Analysis of 2D and 3D ICs at A14 Node Designed with Back-side Power Delivery Network

11. Scaled FinFETs Connected by Using Both Wafer Sides for Routing via Buried Power Rails

16. Magnetoresistance and spintronic anisotropy induced by spin excitations along molecular spin chains

17. Buried Power Rail Scaling and Metal Assessment for the 3 nm Node and Beyond

18. Supervia Process Integration and Reliability Compared to Stacked Vias Using Barrierless Ruthenium

19. Buried Power Rail Integration with Si FinFETs for CMOS Scaling beyond the 5 nm Node

20. Buried power rail integration for CMOS scaling beyond the 3 nm node

21. Consolidated picture of tunnelling spintronics across oxygen vacancy states in MgO

22. Über die Beulung von Rechteckplatten mit anfänglicher Ausbiegung

24. 28nm pitch single exposure patterning readiness by metal oxide resist on 0.33NA EUV lithography

25. Oxygen-vacancy driven tunnelling spintronics across MgO

27. Beiträge zur Baustatik, Elastizitätstheorie, Stabilitätstheorie, Bodenmechanik

28. Localized states in advanced dielectrics from the vantage of spin- and symmetry-polarized tunnelling across MgO

31. Oxygen-vacancy driven tunnelling spintronics across MgO

44. Beitrag zur Berechnung der allseitig eingespannten Rechteckplatte

47. Beitrag zur Berechnung der Tragwerke mittels der Formänderungsmethode

48. Der Rammschlag

49. Über die Lösung technischer Eigenwertprobleme

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