23 results on '"Trigg, A.D."'
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2. Work function tuning of metal nitride electrodes for advanced CMOS devices
3. Charge trapping and retention behaviors of Ge nanocrystals distributed in the gate oxide near the gate synthesized by low-energy ion implantation
4. Modular sensor chip design for package stress evaluation and reliability characterisation
5. Dry etching of AlxGa1-xN/GaN by CCl2F2 chemistry for device isolation
6. Non-destructive testing of a high dense small dimension through silicon via (TSV) array structures by using 3D X-ray computed tomography method (CT scan).
7. Design for reliability in via middle and via last 3-D chipstacks incorporating TSVs.
8. Silicon Nanowire Arrays for Ultrasensitive Label-Free Detection of DNA.
9. Fault isolation and failure analysis techniques for high density packaging.
10. TDDB reliability assessments of 0.13 μm Cu/low-k interconnects fabricated with PECVD low-k materials.
11. A Combined Infrared/Visible Photoemission Microscope
12. Temperature Measurement on Micromachined IR Bolometers Using an Infrared Microscope
13. The infrared photoemission microscope as a tool for semiconductor device failure analysis.
14. Dry etching of AlxGa1- xN/GaN by CCl2F2 chemistry for device isolation.
15. Correlation of LED device performance with materials and processing using CL and EBIC techniques.
16. Canvas: An Intelligent Colour Selection Tool For VDU Images.
17. Recent Advances in Microanalysis and Surface Analysis Using SEMs and Spectrometry
18. Surface analysis techniques and their application to materials characterisation
19. Canvas: An Intelligent Colour Selection Tool For VDU Images
20. The infrared photoemission microscope as a tool for semiconductor device failure analysis
21. Thermal performance and reliability aspects of silicon hybrid multi-chip modules
22. Lanthanide-incorporated metal nitrides with tunable work function and good thermal stability for NMOS devices.
23. Thermal performance and reliability aspects of silicon hybrid multi-chip modules.
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