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2. Structural characterization of ion-beam synthesized NiSi2 layers

Author

Wu, M.F., Wachter, J. de, Bavel, A.-M. van, Moons, R., Vantomme, A., Pattyn, H., Langouche, G., Bender, H., Vanhellemont, J., Temst, K., and Bruynseraede, Y.

Subjects
Ion bombardment -- Usage, Nickel alloys -- Research, Structural dynamics -- Analysis, Transmission electron microscopes -- Usage, Backscattering -- Usage, Physics
Published
1995

3. α-Emission channeling studies of the lattice site of oversized atoms implanted in Fe and Ni single crystals

Author

Wachter, J. De, primary, Blässer, S., additional, Hofsäss, H., additional, Jahn, S., additional, Lindroos, M., additional, Moons, R., additional, Pattyn, H., additional, Restle, M., additional, Vantomme, A., additional, Wahl, U., additional, Duppen, P. Van, additional, Collaboration, the ISOLDE, additional, and Langouche, G., additional

Published
1996
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4. Growth and properties of ion beam synthesized Si/CoxNi1-xSi2/Si(111) structures.

Author

Wu, M. F., Wachter, J. De, Van Bavel, A.-M., Pattyn, H., Langouche, G., Vanhellemont, J., Bender, H., Temst, K., Wuyts, B., and Bruynseraede, Y.

Subjects
*ION bombardment, *SILICIDES, *BACKSCATTERING, *SPECTRUM analysis
Abstract

Provides information on a study that reported on the quality, strain and orientation of ion beam synthesis-formed Co[subx]Ni[sub1-x]Si[sub2] ternary silicide layers studied by Rutherford backscattering spectroscopy channeling, Auger electron spectroscopy transmission electron microscopy and x-ray diffraction. Details on the measurement of symmetric reflection and asymmetric reflection x-ray rocking curves; Requirement for preparing the ion beam synthesis-formed ternary silicide layers.

Published
1994
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7. [Untitled]

Author

Moons, R., Blaasser, S., Dekoster, J., Vantomme, A., Wachter, J. De, and Langouche, G.

Published
1998
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