19 results on '"Wier, Brian R."'
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2. Reliability Differences Between SiGe HBTs Optimized for High-Performance and Medium-Breakdown
3. Emitter-Base Profile Optimization of SiGe HBTs for Improved Thermal Stability and Frequency Response at Low-Bias Currents
4. Revisiting Safe Operating Area: SiGe HBT Aging Models for Reliability-Aware Circuit Design
5. Collector Transport in SiGe HBTs Operating at Cryogenic Temperatures
6. Hot-Carrier-Damage-Induced Current Gain Enhancement (CGE) Effects in SiGe HBTs
7. Limiting Effects on the Design of Vertical Superjunction Collectors in SiGe HBTs
8. Predicting hard failures and maximum usable range of sige HBTs
9. Operation of SiGe HBTs Down to 70 mK
10. Physical Differences in Hot Carrier Degradation of Oxide Interfaces in Complementary (n-p-n+p-n-p) SiGe HBTs
11. On the use of vertical superjunction collectors for enhanced breakdown performance in SiGe HBTs
12. A Physics-Based Circuit Aging Model for Mixed-Mode Degradation in SiGe HBTs
13. The Role of Negative Feedback Effects on Single-Event Transients in SiGe HBT Analog Circuits
14. Optimizing the vertical profile of SiGe HBTs to mitigate radiation-induced upsets
15. Bias- and Temperature-Dependent Accumulated Stress Modeling of Mixed-Mode Damage in SiGe HBTs
16. A Comparison of Field and Current-Driven Hot-Carrier Reliability in NPN SiGe HBTs
17. Large-Signal Reliability Analysis of SiGe HBT Cascode Driver Amplifiers
18. A 0.8 THz $f_{\rm MAX}$ SiGe HBT Operating at 4.3 K
19. A 0.8 THz fMAX SiGe HBT Operating at 4.3 K.
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