130 results on '"scanning Kelvin probe microscopy"'
Search Results
2. Self-healing properties of microencapsulated linseed oil-poly(urea formaldehyde) additives embedded polyester coating on Galvalume steel sheet.
- Author
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Bhardwaj, Sushant, Rani, Nitu, Singh, Arun Kumar, Chauhan, Ankita, and Rishabh
- Subjects
UREA-formaldehyde resins ,SCANNING probe microscopy ,SHEET steel ,POLYESTERS ,LINSEED oil ,SURFACE coatings ,FORMALDEHYDE - Abstract
Linseed oil and poly(urea-formaldehyde)-based microcapsules with an 82% weight ratio of core/shell and a mean outer diameter of about 100 μm were synthesised by in-situ polymerisation. These microcapsules were dispersed in polyester paint and then primer-coated Galvalume sheets were painted with microcapsule loaded (MC) and neat (no microcapsules) paints. These painted samples were scribed and examined using various characterisation techniques to evaluate their self-healing properties. SST and CCT showed that the electrolyte diffusion was suppressed in the MC sample, whereas the neat sample was noticeably blistered due to under-film corrosion. Scanning Kelvin Probe microscopy, SKP supported this finding wherein the Volta potential of the neat sample increased in the positive direction indicating cathodic delamination, whereas no significant change occurred in the MC sample. SEM-EDAX revealed the surface morphology and composition of the samples. Furthermore, EIS showed that microcapsule addition increased the pore resistance and decreased the coating capacitance of the polyester paint. [ABSTRACT FROM AUTHOR]
- Published
- 2024
- Full Text
- View/download PDF
3. The n-p tunable room-temperature hydrogen response of SnO2-modified MoS2 thin films and its in-situ SKPM study
- Author
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Tan, Lun, Liu, Xianzhen, Yang, Piaoyun, Li, Wei, Yang, Weijia, Li, Ang, Gu, Haoshuang, and Wang, Zhao
- Published
- 2023
- Full Text
- View/download PDF
4. One-dimensional van der Waals material SbPS4 with large bandgap for UV sensing applications.
- Author
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Cho, Sooheon, Zhang, Xiaojie, Lee, Bom, Kang, Jinsu, Jeong, Byung Joo, Kim, Dahoon, Kim, Yeong Hyeop, Park, Jae-Hyuk, Kim, Sang Hyuk, Yu, Hak Ki, and Choi, Jae-Young
- Subjects
- *
SCANNING probe microscopy , *OPTOELECTRONIC devices , *NANOWIRES , *SEMICONDUCTOR nanowires , *CRYSTAL lattices , *ENVIRONMENTAL monitoring , *MOLECULAR structure - Abstract
UV sensors possess high importance for modern electronics such as environmental monitoring, health diagnostics, and optoelectronic devices. Thus UV-sensing-materials with high stability has drawn significant interest for next generation UV sensors. Herein, a simple synthesis method of SbPS 4 has been proposed. Then the SbPS 4 crystals are effectively delaminated by micromechanical exfoliation into a few-nanometer-scale nanowires, which is the first demonstration of the material's possibility of exfoliation down to one-molecular-layer thickness. Weak van der Waals (vdW) interaction within the crystal lattice can be easily overcome. The exfoliated SbPS 4 nanowires showed one-dimensional tube structure, and the work function of SbPS 4 showed strong thickness dependence and was confirmed through Scanning Kelvin probe microscopy. The bandgap of 2.54 eV of SbPS 4 , showed great sensitivity to UV lights, depicting SbPS 4 as a promising future UV sensing material for future optoelectronic application. [Display omitted] • Synthesis of one-dimensional van der Waals material SbPS 4 with a tubular molecular structure • Single chain exfoliation of SbPS 4 and its thickness-dependency of work function • Optical property of SbPS 4 as UV-detecting material [ABSTRACT FROM AUTHOR]
- Published
- 2024
- Full Text
- View/download PDF
5. Exploring the effect of varying regimes of ion fluence on the optical and surface electronic properties of graphene.
- Author
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Mahanta, Tanmay, Kumar, Sanjeev, Kanjilal, D., and Mohanty, Tanuja
- Subjects
- *
ELECTRON work function , *SURFACE properties , *GRAPHENE , *RUTHERFORD backscattering spectrometry , *HEAVY ions , *ASTROPHYSICAL radiation , *ION beams - Abstract
In this work, the effect of the ion fluence-dependent defect formation on the modification of surface electronic and optical properties of graphene has been investigated. The chemical vapor deposited (CVD) graphene samples were irradiated with 70 MeV Si+5 swift heavy ions (SHI) with varying fluence to study the defect formation mechanism and the role of ion beam fluence in modulating its surface electronic property such as work function. At a low ion dose, acceptor doping via vacancy creation was observed. The redshift in absorption peak position, the blueshift in Raman peak position, and the enhancement in work function values are indicators of such doping effect at low fluence. In contrast, the dense electronic excitation-dominated extended defects were realized at a higher ion dose showing strain-induced modifications in the optoelectronic properties of graphene. This work offers an effective strategy to control defect formation and systematically alter graphene's optical and electronic properties. The experimental findings will be useful for the applicability of graphene under extreme radiation conditions and space research. [ABSTRACT FROM AUTHOR]
- Published
- 2022
- Full Text
- View/download PDF
6. Vapor Deposition of Bilayer 3R MoS 2 with Room-Temperature Ferroelectricity.
- Author
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Jiang H, Li L, Wu Y, Duan R, Yi K, Wu L, Zhu C, Luo L, Xu M, Zheng L, Gan X, Zhao W, Wang X, and Liu Z
- Abstract
Two-dimensional ultrathin ferroelectrics have attracted much interest due to their potential application in high-density integration of non-volatile memory devices. Recently, 2D van der Waals ferroelectric based on interlayer translation has been reported in twisted bilayer h-BN and transition metal dichalcogenides (TMDs). However, sliding ferroelectricity is not well studied in non-twisted homo-bilayer TMD grown directly by chemical vapor deposition (CVD). In this paper, for the first time, experimental observation of a room-temperature out-of-plane ferroelectric switch in semiconducting bilayer 3R MoS
2 synthesized by reverse-flow CVD is reported. Piezoelectric force microscopy (PFM) hysteretic loops and first principle calculations demonstrate that the ferroelectric nature and polarization switching processes are based on interlayer sliding. The vertical Au/3R MoS2 /Pt device exhibits a switchable diode effect. Polarization modulated Schottky barrier height and polarization coupling of interfacial deep states trapping/detrapping may serve in coordination to determine switchable diode effect. The room-temperature ferroelectricity of CVD-grown MoS2 will proceed with the potential wafer-scale integration of 2D TMDs in the logic circuit., (© 2024 Wiley‐VCH GmbH.)- Published
- 2024
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7. Comparative characterization of the surface state of Ti-6Al-4V substrates in different pre-bonding conditions
- Author
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M. Pizzorni, E. Lertora, C. Mandolfino, S. Vicini, M. Salerno, and M. Prato
- Subjects
Surface treatment ,Titanium and alloys ,Bonding mechanism analysis ,Wettability ,Surface oxidation ,Scanning Kelvin probe microscopy ,Materials of engineering and construction. Mechanics of materials ,TA401-492 - Abstract
This paper deals with the interfacial adhesion properties of Ti-6Al-4V alloy substrates, prepared by using different treatment protocols selected on the basis of their different effectiveness, and bonded using a structural, high-strength epoxy adhesive. The alternative pre-bonding treatments were sodium hydroxide anodization and low-pressure-plasma treatment, the effects of which were compared to that of a base preparation via solvent degreasing of the substrates’ surface. The treated surfaces were joined according to standard protocols, and then tested for shear strength. The mechanical results were then correlated to surface characteristics of the substrates such as oxidation state and wettability. Parallel scanning Kelvin-probe measurements allowed us to focus our attention on the possible role of the electrical properties of the substrates. We observed that each treatment entails different behavior of the electrical potential of the surface, which correlates with the mechanical strength of the joints. The results suggest that an evaluation of the surface potential of titanium-alloy substrates might be a promising, indicative supplementary parameter for the evaluation of their pre-bonding surface conditions, allowing correlations with presence/absence of an oxide layer at the resin-substrate interface.
- Published
- 2021
- Full Text
- View/download PDF
8. Light-Emitting Electrochemical Cells: Mechanisms and Formal Description
- Author
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van Reenen, Stephan, Kemerink, Martijn, and Costa, Rubén D., editor
- Published
- 2017
- Full Text
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9. AFM-Based Microelectrical Characterization of Grain Boundaries in Cu(In,Ga)Se2 Thin Films
- Author
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Al-Jassim, M
- Published
- 2005
10. Charge Distribution and Stability of SiO2 Nanoarray Electret.
- Author
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Liang, Fei, Li, Hua Yang, Wang, Ying, Kuang, Shuang Yang, Fan, You Jun, Wang, Zhong Lin, and Zhu, Guang
- Subjects
DIFFUSION barriers ,WATER repellents ,SCANNING probe microscopy ,WATER purification ,ATOMIC force microscopy - Abstract
The devices based on SiO2 electret have significant applications in various MEMS sensors. However, the charge stability of SiO2 electret suffered from the water percolation, which seriously restricts its application. In this work, the long‐term charge stability of the SiO2 nanoarray electret (SiO2 NAE) without any water repellent treatment is demonstrated. When the oxidation time is 1.5 h, the potential decay of the SiO2 NAE is less than 46% during 60 days with an original potential of −120 V. The long‐term charge stability of the SiO2 NAE is attributed to its unique charge decay process and the large H2O diffusion barrier in the SiO2 NAE: firstly, the charge trapped in the planar part of the SiO2 NAE decays rapidly. Then, residual charge stored in the SiO2 nanoarray. Eventually, the large H2O diffusion barrier in the interface of Si/SiO2 effectively hinders the charge decay. In addition, we demonstrate the unique charge stability of nanoelectret, which has a promising application in developing high performance electret‐based devices. [ABSTRACT FROM AUTHOR]
- Published
- 2020
- Full Text
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11. AFM Visualization of Ferroelastic and Ferroelectric Domains in 2-Methylbenzimidazole С8H8N2 Crystals.
- Author
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Balashova, E. V., Krichevtsov, B. B., Kunkel, T. S., and Ankudinov, A. V.
- Abstract
The domain structure on the surface of 2-methylbenzimidazole (MBI) crystals is studied using various modes of atomic-force microscopy, which made it possible to visualize the surface potential distribution. MBI crystals are grown by evaporation from a saturated ethanol solution. Using the scanning Kelvin probe microscopy mode, the potential distribution is visualized on the (001) cleavages of a single crystal, which is a periodic structure of charged stripes oriented along the 〈110〉
tetr axis. This pattern can be explained by the presence of a system of ferroelastic domains with charged domain walls on the surface, which compensates deformation in the surface layers occurring during cleavage. An equilibrium structure of ferroelectric domains with a polarization component perpendicular to the surface is found on the {110} microcrystal surface using the scanning Kelvin probe microscopy mode. The electrostatic force microscopy mode makes it possible to visualize ferroelastic domain walls. It is shown that, in the case of a microcrystal, the action of a locally applied electric pulse causes the displacement of both ferroelectric and ferroelastic domain walls. The potential distribution over the (001) cleavage surface of the single crystal after external action remains unchanged. [ABSTRACT FROM AUTHOR]- Published
- 2021
- Full Text
- View/download PDF
12. Correlation between surface morphology and potential profile in OFETs with zone-cast TIPS-Pentacene as seen by scanning Kelvin probe microscopy.
- Author
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Kucinska, M., Szymanski, M.Z., Frac, I., Chandezon, F., and Ulanski, J.
- Subjects
- *
SURFACE potential , *ORGANIC field-effect transistors , *SCANNING probe microscopy , *SURFACE morphology , *ATOMIC force microscopy - Abstract
Charge-carrier transport in the channel of bottom gate, top contact organic field effect transistors with anisotropic layers of 6,13-bis(triisopropylsilylethynyl) pentacene (TIPS-Pentacene) obtained by zone casting was investigated using scanning Kelvin probe microscopy combined with atomic force microscopy. The TIPS-Pentacene continuous layers consisted of thin crystals unidirectionally oriented in the channel. Devices with perpendicular and parallel charge flow in the transistor channel were prepared. It was found that irregularities in the surface morphology at the semiconductor layer in the transistor channel are correlated with the local potential profile, and that the channel resistance strongly depends on the orientation of the TIPS-Pentacene crystals. [ABSTRACT FROM AUTHOR]
- Published
- 2019
- Full Text
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13. AFM Visualization of Ferroelastic and Ferroelectric Domains in 2-Methylbenzimidazole С8H8N2 Crystals
- Author
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Balashova, E. V., Krichevtsov, B. B., Kunkel, T. S., and Ankudinov, A. V.
- Published
- 2021
- Full Text
- View/download PDF
14. Exfoliation and Characterization of V2Se9 Atomic Crystals.
- Author
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Bum Jun Kim, Byung Joo Jeong, Seungbae OH, Sudong Chae, Kyung Hwan Choi, Nasir, Tuqeer, Sang Hoon Lee, Kwan-Woo Kim, Hyung Kyu Lim, Ik Jun Choi, Ji-Yun Moon, Hak Ki Yu, Jae-Hyun Lee, and Jae-Young Choi
- Subjects
- *
SOLID state physics , *VANADIUM , *NANORIBBONS - Abstract
Mass production of one-dimensional, V2Se9 crystals, was successfully synthesized using the solid-state reaction of vanadium and selenium. Through the mechanical exfoliation method, the bulk V2Se9 crystal was easily separated to nanoribbon structure and we have confirmed that as-grown V2Se9 crystals consist of innumerable single V2Se9 chains linked by van der Waals interaction. The exfoliated V2Se9 flakes can be controlled thickness by the repeated-peeling method. In addition, atomic thick nanoribbon structure of V2Se9 was also obtained on a 300 nm SiO2/Si substrate. Scanning Kelvin probe microscopy analysis was used to explore the variation of work function depending on the thickness of V2Se9 flakes. We believe that these observations will be of great help in selecting suitable metal contacts for V2Se9 and that a V2Se9 crystal is expected to have an important role in future nano-electronic devices. [ABSTRACT FROM AUTHOR]
- Published
- 2018
- Full Text
- View/download PDF
15. Direct Observation of Surface Potential Distribution in Insulation Resistance Degraded Acceptor-Doped BaTiO3 Multilayered Ceramic Capacitors.
- Author
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Hong, Kootak, Lee, Tae Hyung, Suh, Jun Min, Park, Jae-Sung, Kwon, Hyung-Soon, Choi, Jaeho, and Jang, Ho Won
- Abstract
Abstract: Insulation resistance (IR) degradation in BaTiO
3 is a key issue for developing miniaturized multilayer ceramic capacitors (MLCCs) with high capacity. Despite rapid progress in BaTiO3 -based MLCCs, the mechanism of IR degradation is still controversial. In this study, we demonstrate the Al doping effect on IR degradation behavior of BaTiO3 MLCCs by electrical measurements and scanning Kelvin probe microscopy (SKPM). As the Al doping concentration in BaTiO3 increases, IR degradation of MLCCs seems to be suppressed from electrical characterization results. However, SKPM results reveal that the conductive regions near the cathode become lager with Al doping after IR degradation. The formation of conducting regions is attributed to the migration of oxygen vacancies, which is the origin of IR degradation in BaTiO3 , in dielectric layers. These results imply that acceptor doping in BaTiO3 solely cannot suppress the IR degradation in MLCC even though less asymmetric IR characteristics and IR degradation in MLCCs with higher Al doping concentration are observed from electrical characterization. Our results strongly suggest that observing the surface potential distribution in IR degraded dielectric layers using SKPM is an effective method to unravel the mechanism of IR degradation in MLCCs.Graphical Abstract:[ABSTRACT FROM AUTHOR]
- Published
- 2018
- Full Text
- View/download PDF
16. Step-by-step surface potential tuning of patterned graphene by polyelectrolyte coating.
- Author
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Salerno, Marco, El Merhie, Amira, Diaspro, Alberto, and Dante, Silvia
- Subjects
- *
GRAPHENE , *SURFACE potential , *POLYELECTROLYTES , *METAL coating , *NANOFABRICATION - Abstract
The fine control of the interfacial properties of functionalized graphene is a key point for its applications, especially in biosensing devices. We have here used an in-house developed technique to fabricate microsized patterned graphene via laser ablation and then we have functionalized the interface with poly- d -lysine, a biocompatible polyelectrolyte normally used as a promoter for cell adhesion. Scanning Kelvin probe microscopy shows that a surface potential contrast appears at the patterned regions, with ablated regions of silicon substrate exhibiting higher surface potential than the surrounding background, whereas both levels have negative values. By subsequent coating with the poly- d -lysine it is possible to change stepwise the surface potential levels, while keeping the contrast at the patterned regions constant, up to neutralizing the initial negative values. With further dipping in a polyelectrolyte solution of opposite sign, such as polystyrene sulfonate, it is then possible to decrease the surface potential shifting it again back to negative values. The starting substrate chosen for graphene transfer allows deciding the sign of the surface potential contrast between two adjacent regions of the pattern. [ABSTRACT FROM AUTHOR]
- Published
- 2018
- Full Text
- View/download PDF
17. Scanning Kelvin Probe Microscopy investigation of the contact resistances and charge mobility in n-type PDIF-CN2 thin-film transistors.
- Author
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Chianese, Federico, Chiarella, Fabio, Barra, Mario, Cassinese, Antonio, and Carella, Antonio
- Subjects
- *
KELVIN probe force microscopy , *CHARGE carrier mobility , *THIN film transistors , *CONTACT resistance (Materials science) , *ORGANIC light emitting diodes - Abstract
In this paper, Scanning Kelvin Probe Microscopy (SKPM) was applied in combination with standard current-voltage measurements to assess the contact resistance ( R C ) effects and to estimate the contact-free charge carrier mobility in n-type transistors based on evaporated films of PDIF-CN 2 . This analysis was carried out in particular as a function of the applied polarization voltages. The separate contributions to the R C phenomenon coming from the injecting (source) and extracting (drain) electrodes were investigated with the possibility to separately analyze the specific electrical behaviour of these two regions. In agreement with previous results, the experimental data here discussed show that the devices under analysis are not simply injected limited. Voltage drops at both the injecting and extracting contacts must be taken into consideration. However, it is worth to mention that for the bottom-contact devices here investigated, a minimum R C of 5.5 kΩ cm was found in linear regime. These values are significantly lower (i.e. by a factor 5×) than those previously reported for other perylene dimiide thin-film devices with bottom-contact configuration. [ABSTRACT FROM AUTHOR]
- Published
- 2018
- Full Text
- View/download PDF
18. Uniform Surface Characteristics in Sequentially Polymerized Polyurea Films.
- Author
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Choi, Ui‐Jin, Kim, Hyein, Park, Yi‐Seul, and Lee, Jin Seok
- Subjects
- *
SURFACE analysis , *MOLECULAR orientation , *KELVIN probe force microscopy , *SURFACE potential , *STANDARD deviations , *POLYMERIZATION - Published
- 2018
- Full Text
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19. Imaging Graphene Moiré Superlattices via Scanning Kelvin Probe Microscopy
- Author
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Rajiv Giridharagopal, David S. Ginger, Xiaodong Xu, Kaichen Xie, Ting Cao, Junxi Yu, Yuhao Li, and Jiangyu Li
- Subjects
Condensed Matter - Materials Science ,Materials science ,Graphene ,business.industry ,Mechanical Engineering ,Superlattice ,Stacking ,Bioengineering ,Scanning kelvin probe microscopy ,Physics - Applied Physics ,02 engineering and technology ,General Chemistry ,Electronic structure ,Moiré pattern ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,law.invention ,Piezoresponse force microscopy ,law ,Optoelectronics ,General Materials Science ,Work function ,0210 nano-technology ,business - Abstract
Moir\'e superlattices in van der Waals heterostructures are gaining increasing attention because they offer new opportunities to tailor and explore unique electronic phenomena when stacking 2D materials with small twist angles. Here, we reveal local surface potentials associated with stacking domains in twisted double bilayer graphene (TDBG) moir\'e superlattices. Using a combination of both lateral Piezoresponse Force Microscopy (LPFM) and Scanning Kelvin Probe Microscopy (SKPM), we distinguish between Bernal (ABAB) and rhombohedral (ABCA) stacked graphene and directly correlate these stacking configurations with local surface potential. We find that the surface potential of the ABCA domains is ~15 mV higher (smaller work function) than that of the ABAB domains. First-principles calculations based on density functional theory further show that the different work functions between ABCA and ABAB domains arise from the stacking dependent electronic structure. We show that, while the moir\'e superlattice visualized by LPFM can change with time, imaging the surface potential distribution via SKPM appears more stable, enabling the mapping of ABAB and ABCA domains without tip-sample contact-induced effects. Our results provide a new means to visualize and probe local domain stacking in moir\'e superlattices along with its impact on electronic properties., Comment: 15 pages, 4 figures
- Published
- 2021
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20. Scanning Kelvin Probe Microscopy Reveals Planar Defects Are Sources of Electronic Disorder in Organic Semiconductor Crystals.
- Author
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Wu, Yanfei, Ren, Xinglong, McGarry, Kathryn A., Bruzek, Matthew J., Douglas, Christopher J., and Frisbie, C. Daniel
- Subjects
KELVIN probe force microscopy ,ORGANIC semiconductors ,SINGLE crystals ,CRYSTAL defects ,X-ray diffraction - Abstract
Electronic disorder in organic semiconductor single crystals, manifested as parallel surface potential domains with potential variations ranging from tens to hundreds of mV, is observed by scanning Kelvin probe microscopy. Chemical etching and X-ray diffraction indicate that the potential domains are correlated with planar defects such as stacking faults. The results have important implications for understanding structure-transport relationships in organic semiconductor single crystals. [ABSTRACT FROM AUTHOR]
- Published
- 2017
- Full Text
- View/download PDF
21. Sensing the facet orientation in silver nano-plates using scanning Kelvin probe microscopy in air.
- Author
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Abdellatif, M.H., Salerno, M., Polovitsyn, Anatolii, Marras, Sergio, and De Angelis, Francesco
- Subjects
- *
ORIENTATION (Chemistry) , *SILVER nanoparticles , *STRUCTURAL plates , *KELVIN probe force microscopy , *AIR flow , *ELECTRONIC noise - Abstract
The work function of nano-materials is important for a full characterization of their electronic properties. Because the band alignment, band bending and electronic noise are very sensitive to work function fluctuations, the dependence of the work function of nano-scale crystals on facet orientation can be a critical issue in optimizing optoelectronic devices based on these materials. We used scanning Kelvin probe microscopy to assess the local work function on samples of silver nano-plates at sub-micrometric spatial resolution. With the appropriate choice of the substrate and based on statistical analysis, it was possible to distinguish the surface potential of the different facets of silver nano-plates even if the measurements were done in ambient conditions without the use of vacuum. A phenomenological model was used to calculate the differences of facet work function of the silver nano-plates and the corresponding shift in Fermi level. This theoretical prediction and the experimentally observed difference in surface potential on the silver nano-plates were in good agreement. Our results show the possibility to sense the nano-crystal facets by appropriate choice of the substrate in ambient conditions. [ABSTRACT FROM AUTHOR]
- Published
- 2017
- Full Text
- View/download PDF
22. Induced inhomogeneity in graphene work function due to graphene - TiO2/Ag/glass substrate interaction.
- Author
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Abdellatif, M.H., Keshavan, Sandeep, Dante, Silvia, and Salerno, Marco
- Subjects
- *
OPTOELECTRONIC devices , *GRAPHENE , *KELVIN probe force microscopy , *ELECTRIC fields , *TITANIUM dioxide - Abstract
Important issues in optoelectronic devices based on exfoliated graphene are the electronic noise due to the interaction between graphene flakes and the substrate, and the accumulation of electrical charge at the flake edges. These effects, in addition to the distribution of flakes in the composites, being random and locally showing multiple overlaps, cause significant Inhomogeneity in the measured work function of the graphene-based materials. To shed light on the above effects, we investigated both graphene flakes and single-layer graphene by means of scanning Kelvin probe microscopy in ambient conditions. The graphene materials were deposited on rough substrates of silver with a top layer of titanium dioxide. The roughness caused the random disorder of interest for characterization, while the thin dielectric layer of titanium dioxide helped in keeping the electric field localized and provided better contrast in the surface potential images. It is demonstrated that proper engineering of the substrate can minimize the work function inhomogeneity. Additionally, SKPM allows for local mapping of graphene flakes overlaps and thus effective thickness, for possible quality control in produced devices. [ABSTRACT FROM AUTHOR]
- Published
- 2017
- Full Text
- View/download PDF
23. Scanning Kelvin Probe Microscopy Reveals That Ion Motion Varies with Dimensionality in 2D Halide Perovskites
- Author
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Franziska Muckel, David S. Ginger, Fangyuan Jiang, Rajiv Giridharagopal, Justin Pothoof, and Jian Wang
- Subjects
Materials science ,Renewable Energy, Sustainability and the Environment ,Ion migration ,Energy Engineering and Power Technology ,Halide ,Scanning kelvin probe microscopy ,02 engineering and technology ,010402 general chemistry ,021001 nanoscience & nanotechnology ,01 natural sciences ,0104 chemical sciences ,Ion ,Fuel Technology ,Chemistry (miscellaneous) ,Chemical physics ,Materials Chemistry ,0210 nano-technology ,Curse of dimensionality - Abstract
We study ion migration in 2D lead halide perovskites of varying dimensionality using scanning Kelvin probe microscopy (SKPM). We perform potentiometry on micrometer-scale lateral junctions in the a...
- Published
- 2020
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24. CoNiFe Layered Double Hydroxide/RuO2.1 Nanosheet Superlattice as Carbon-Free Electrocatalysts for Water Splitting and Li–O2 Batteries
- Author
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Nobuyuki Sakai, Xinming Li, Renzhi Ma, Takaaki Taniguchi, Dai-Ming Tang, Takayoshi Sasaki, and Xueyi Lu
- Subjects
Materials science ,Superlattice ,Oxygen evolution ,chemistry.chemical_element ,Scanning kelvin probe microscopy ,02 engineering and technology ,010402 general chemistry ,021001 nanoscience & nanotechnology ,Electrocatalyst ,01 natural sciences ,0104 chemical sciences ,chemistry.chemical_compound ,chemistry ,Chemical engineering ,Hydroxide ,Water splitting ,General Materials Science ,0210 nano-technology ,Carbon ,Nanosheet - Abstract
Efficient electrocatalysts are highly demanded for oxygen evolution reaction (OER) in water splitting and metal–air batteries. Here, superlattice structured materials composed of CoNiFe layered dou...
- Published
- 2020
- Full Text
- View/download PDF
25. Charge Distribution and Stability of SiO 2 Nanoarray Electret
- Author
-
Zhong Lin Wang, Fei Liang, Hua Yang Li, Shuang Yang Kuang, Ying Wang, You Jun Fan, and Guang Zhu
- Subjects
Biomaterials ,Materials science ,Renewable Energy, Sustainability and the Environment ,business.industry ,Atomic force microscopy ,Materials Chemistry ,Energy Engineering and Power Technology ,Optoelectronics ,Charge density ,Scanning kelvin probe microscopy ,Electret ,business ,Stability (probability) - Published
- 2020
- Full Text
- View/download PDF
26. Exfoliation and Characterization of V2Se9 Atomic Crystals
- Author
-
Bum Jun Kim, Byung Joo Jeong, Seungbae OH, Sudong Chae, Kyung Hwan Choi, Tuqeer Nasir, Sang Hoon Lee, Kwan-Woo Kim, Hyung Kyu Lim, Ik Jun Choi, Ji-Yun Moon, Hak Ki Yu, Jae-Hyun Lee, and Jae-Young Choi
- Subjects
V2Se9 ,atomic crystal ,mechanical exfoliation ,scanning Kelvin probe microscopy ,Chemistry ,QD1-999 - Abstract
Mass production of one-dimensional, V2Se9 crystals, was successfully synthesized using the solid-state reaction of vanadium and selenium. Through the mechanical exfoliation method, the bulk V2Se9 crystal was easily separated to nanoribbon structure and we have confirmed that as-grown V2Se9 crystals consist of innumerable single V2Se9 chains linked by van der Waals interaction. The exfoliated V2Se9 flakes can be controlled thickness by the repeated-peeling method. In addition, atomic thick nanoribbon structure of V2Se9 was also obtained on a 300 nm SiO2/Si substrate. Scanning Kelvin probe microscopy analysis was used to explore the variation of work function depending on the thickness of V2Se9 flakes. We believe that these observations will be of great help in selecting suitable metal contacts for V2Se9 and that a V2Se9 crystal is expected to have an important role in future nano-electronic devices.
- Published
- 2018
- Full Text
- View/download PDF
27. Effect of contact- and sliding-mode electrification on nanoscale charge transfer for energy harvesting.
- Author
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Zhou, Yu, Li, Shengming, Niu, Simiao, and Wang, Zhong
- Abstract
The process of charge transfer based on triboelectrification (TE) and contact electrification (CE) has been recently utilized as the basis for a new and promising energy harvesting technology, i.e., triboelectric nanogenerators, as well as selfpowered sensors and systems. The electrostatic charge transfer between two surfaces can occur in both the TE and the CE modes depending on the involvement of relative sliding friction. Does the sliding behavior in TE induce any fundamental difference in the charge transfer from the CE? Few studies are available on this comparison because of the challenges in ruling out the effect of the contact area using traditional macro-scale characterization methods. This paper provides the first study on the fundamental differences in CE and TE at the nanoscale based on scanning probe microscopic methods. A quantitative comparison of the two processes at equivalent contact time and force is provided, and the results suggest that the charge transfer from TE is much faster than that from CE, but the saturation value of the transferred charge density is the same. The measured frictional energy dissipation of ∼11 eV when the tip scans over distance of 1 Å sheds light on a potential mechanism: The friction may facilitate the charge transfer process via electronic excitation. These results provide fundamental guidance for the selection of materials and device structures to enable the TE or the CE in different applications; the CE mode is favorable for frequent moderate contact such as vibration energy harvesting and the TE mode is favorable for instant movement such as harvesting of energy from human walking. [ABSTRACT FROM AUTHOR]
- Published
- 2016
- Full Text
- View/download PDF
28. Zn Wetted CeO2 Based Composite Galvanization: An Effective Route To Combat Biofouling
- Author
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Manikandan Nair Manu, Rubina Basheer, Mashood Ameen Sha, S.R. Arunima, Ahammedkannu Hairunnisa Riyas, T.C. Bhagya, Sheik Muhammadhu Aboobakar Shibli, Aarcha Vijayan, and Bhuvanendran Revamma Sreelekshmy
- Subjects
Materials science ,Biochemistry (medical) ,Composite number ,Metallurgy ,Biomedical Engineering ,chemistry.chemical_element ,Scanning kelvin probe microscopy ,General Chemistry ,Zinc ,engineering.material ,Galvanization ,Corrosion ,Biomaterials ,Biofouling ,symbols.namesake ,Coating ,chemistry ,engineering ,symbols ,Galvanic cell - Abstract
The present paper reports for the first time the development and application of novel Zn wetted CeO2 (Zn/CeO2) composite galvanic zinc coating to combat microbial induced corrosion (MIC). Zinc meta...
- Published
- 2019
- Full Text
- View/download PDF
29. Correlation between surface morphology and potential profile in OFETs with zone-cast TIPS-Pentacene as seen by scanning Kelvin probe microscopy
- Author
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Izabela Frac, F. Chandezon, M.Z. Szymanski, Jacek Ulanski, and Magdalena Kucinska
- Subjects
Materials science ,Morphology (linguistics) ,business.industry ,organic field effect transistors ,Mechanical Engineering ,Scanning kelvin probe microscopy ,02 engineering and technology ,zone casting ,010402 general chemistry ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,01 natural sciences ,0104 chemical sciences ,Nanomaterials ,Pentacene ,chemistry.chemical_compound ,chemistry ,Mechanics of Materials ,scanning kelvin probe microscopy ,TA401-492 ,Optoelectronics ,General Materials Science ,0210 nano-technology ,business ,Materials of engineering and construction. Mechanics of materials - Abstract
Charge-carrier transport in the channel of bottom gate, top contact organic field effect transistors with anisotropic layers of 6,13-bis(triisopropylsilylethynyl) pentacene (TIPS-Pentacene) obtained by zone casting was investigated using scanning Kelvin probe microscopy combined with atomic force microscopy. The TIPS-Pentacene continuous layers consisted of thin crystals unidirectionally oriented in the channel. Devices with perpendicular and parallel charge flow in the transistor channel were prepared. It was found that irregularities in the surface morphology at the semiconductor layer in the transistor channel are correlated with the local potential profile, and that the channel resistance strongly depends on the orientation of the TIPS-Pentacene crystals.
- Published
- 2019
30. One-dimensional van der Waals material InSeI with large band-gap for optoelectronic applications.
- Author
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Choi, Kyung Hwan, Cho, Sooheon, Jeong, Byung Joo, Lee, Bom, Jeon, Jiho, Kang, Jinsu, Zhang, Xiaojie, Oh, Hyung-Suk, Lee, Jae-Hyun, Yu, Hak Ki, and Choi, Jae-Young
- Subjects
- *
SCANNING probe microscopy , *NANOWIRES , *BAND gaps , *CRYSTAL lattices , *KELVIN probe force microscopy , *VISIBLE spectra , *SINGLE crystals , *OPTOELECTRONIC devices - Abstract
We experimentally demonstrate for the first time that the bulk InSeI crystals can be effectively delaminated by micromechanical exfoliation into a few nanometer-scale InSeI nanowires, due to the presence of weak van der Waals (vdWs) interaction within the crystal lattice. The exfoliated InSeI nanowires show one-dimensional (1D) bundle structure, and the work function of InSeI measured by Scanning Kelvin probe microscopy shows strong dependency on its thickness. The InSeI has a large bandgap corresponding to 2.12 eV, and when applied to a UV-detecting device, it was confirmed that the device with excellent sensitivity can be obtained, because there is little interference in the infrared and visible light regions. Based on these results, InSeI could be a excellent candidate as an additional 1D vdWs material for optoelectronics, including photodetectors or photovoltaic devices. • Synthesis of 1D van der Waals InSeI crystals and single chain exfoliation. • Thickness dependent work functions confirmed via scanning Kelvin probe microscopy. • Optical band gap and its potential application to UV detectors.. [ABSTRACT FROM AUTHOR]
- Published
- 2022
- Full Text
- View/download PDF
31. Direct observation of the potential distribution within organic light emitting diodes under operation.
- Author
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Weigel, Christian S., Kowalsky, Wolfgang, and Saive, Rebecca
- Subjects
- *
KELVIN probe force microscopy , *ORGANIC light emitting diodes , *ELECTROMAGNETIC waves , *SPECTRUM analysis ,POTENTIAL distribution - Abstract
We show the first direct measurement of the potential distribution within organic light emitting diodes (OLEDs) under operation and hereby confirm existing hypotheses about charge transport and accumulation in the layer stack. Using a focused ion beam to mill holes in the diodes we gain access to the cross section of the devices and explore the spatially resolved potential distribution in situ by scanning Kelvin probe microscopy under different bias conditions. In bilayer OLEDs consisting of tris(hydroxyquinolinato) aluminum (Alq3)/ N, N ′-bis(naphthalene-1-yl)- N, N ′-bis(phenyl) benzidine (NPB) the potential exclusively drops across the Alq3 layer for applied bias between onset voltage and a given transition voltage. These findings are consistent with previously performed capacitance-voltage measurements. The behavior can be attributed to charge accumulation at the interface between the different organic materials. Furthermore, we show the potential distribution of devices with different cathode structures and degraded devices to identify the cathode interface as main culprit for decreased performance. (© 2015 WILEY-VCH Verlag GmbH &Co. KGaA, Weinheim) [ABSTRACT FROM AUTHOR]
- Published
- 2015
- Full Text
- View/download PDF
32. Self-Pixelation Through Fracture in VO2 Thin Films
- Author
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Ministerio de Economía, Industria y Competitividad (España), Generalitat de Catalunya, Science Foundation Ireland, Rodríguez, Laura, Corro, Elena del, Conroy, Michele, Moore, Kalani, Sandiumenge, Felip, Domingo, Neus, Santiso, José, Catalán, Gustau, Ministerio de Economía, Industria y Competitividad (España), Generalitat de Catalunya, Science Foundation Ireland, Rodríguez, Laura, Corro, Elena del, Conroy, Michele, Moore, Kalani, Sandiumenge, Felip, Domingo, Neus, Santiso, José, and Catalán, Gustau
- Abstract
Vanadium dioxide (VO2) is an archetypal Mott material with a metal–insulator transition (MIT) at near room temperature. In thin films, this transition is affected by substrate-induced strain but as film thickness increases, the strain is gradually relaxed and the bulk properties are recovered. Epitaxial films of VO2 on (001)-oriented rutile titanium dioxide (TiO2) relax substrate strain by forming a network of fracture lines that crisscross the film along well-defined crystallographic directions. This work shows that the electronic properties associated with these lines result in a pattern that resembles a “street map” of fully strained metallic VO2 blocks separated by insulating VO2 stripes. Each block of VO2 is thus electronically self-insulated from its neighbors, and its MIT can be locally induced optically with a laser, or electronically via the tip of a scanning probe microscope so that the films behave functionally as self-patterned pixel arrays.
- Published
- 2020
33. Balanced Ambipolar Charge Transport in Phenacene/Perylene Heterojunction-Based Organic Field-Effect Transistors
- Author
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Taguchi, Tomoya, Chiarella, Fabio, Barra, Mario, Chianese, Federico, Kubozono, Yoshihiro, Cassinese, Antonio, Taguchi, Tomoya, Chiarella, Fabio, Barra, Mario, Chianese, Federico, Kubozono, Yoshihiro, and Cassinese, Antonio
- Subjects
heterojunction ,organic semiconductor ,charge transfer ,field-effect transistor ,ambipolar response ,film growth mode ,vacuum deposition ,scanning Kelvin probe microscopy - Abstract
Electronic devices relying on the combination of different conjugated organic materials are considerably appealing for their potential use in many applications such as photovoltaics, light emission, and digital/analog circuitry. In this study, the electrical response of field-effect transistors achieved through the evaporation of picene and PDIF-CN2 molecules, two well-known organic semiconductors with remarkable charge transport properties, was investigated. With the main goal to get a balanced ambipolar response, various device configurations bearing double-layer, triple-layer, and codeposited active channels were analyzed. The most suitable choices for the layer deposition processes, the related characteristic parameters, and the electrode position were identified to this purpose. In this way, ambipolar organic field-effect transistors exhibiting balanced mobility values exceeding 0.1 cm2 V-1 s-1 for both electrons and holes were obtained. These experimental results highlight also how the combination between picene and PDIF-CN2 layers allows tuning the threshold voltages of the p-type response. Scanning Kelvin probe microscopy (SKPM) images acquired on picene/PDIF-CN2 heterojunctions suggest the presence of an interface dipole between the two organic layers. This feature is related to the partial accumulation of space charge at the interface being enhanced when the electrons are depleted in the underlayer.
- Published
- 2021
34. Comparative characterization of the surface state of Ti-6Al-4V substrates in different pre-bonding conditions
- Author
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Marco Salerno, Enrico Lertora, Mirko Prato, Silvia Vicini, Marco Pizzorni, and Chiara Mandolfino
- Subjects
Materials science ,Base (chemistry) ,Alloy ,Surface treatment ,Oxide ,Bonding mechanism analysis ,engineering.material ,chemistry.chemical_compound ,Surface treatment, Titanium and alloys, Bonding mechanism analysis, Wettability, Surface oxidation, Scanning Kelvin probe microscopy ,Shear strength ,Chemical Engineering (miscellaneous) ,Composite material ,Materials of engineering and construction. Mechanics of materials ,Engineering (miscellaneous) ,chemistry.chemical_classification ,Anodizing ,Mechanical Engineering ,Titanium and alloys ,Surface oxidation ,chemistry ,Scanning Kelvin probe microscopy ,Mechanics of Materials ,TA401-492 ,Solvent degreasing ,engineering ,Wettability ,Wetting ,Layer (electronics) - Abstract
This paper deals with the interfacial adhesion properties of Ti-6Al-4V alloy substrates, prepared by using different treatment protocols selected on the basis of their different effectiveness, and bonded using a structural, high-strength epoxy adhesive. The alternative pre-bonding treatments were sodium hydroxide anodization and low-pressure-plasma treatment, the effects of which were compared to that of a base preparation via solvent degreasing of the substrates’ surface. The treated surfaces were joined according to standard protocols, and then tested for shear strength. The mechanical results were then correlated to surface characteristics of the substrates such as oxidation state and wettability. Parallel scanning Kelvin-probe measurements allowed us to focus our attention on the possible role of the electrical properties of the substrates. We observed that each treatment entails different behavior of the electrical potential of the surface, which correlates with the mechanical strength of the joints. The results suggest that an evaluation of the surface potential of titanium-alloy substrates might be a promising, indicative supplementary parameter for the evaluation of their pre-bonding surface conditions, allowing correlations with presence/absence of an oxide layer at the resin-substrate interface.
- Published
- 2021
35. Identification of intermetallic phases in the structure of austenitic steel with use of Scanning Kelvin Probe Microscopy
- Author
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Zieliński, Artur and Ryl, Jacek
- Subjects
delta ferrite ,atomic force microscopy ,scanning kelvin probe microscopy - Abstract
Delta ferrite is formed in austenitic steels during the solidification of the alloy and its welds. It can also occur as a stable phase in any temperature range in high-alloy austenitic-ferritic steels. Depending on the amount, it can change into gamma and sigma phases and into ferrite with variable chromium content. The main role of delta ferrite in the welds of austenitic stainless steel is to prevent hot cracking. The minimum content of 5% prevents this phenomenon. However, on the other hand, an increase in the δ-phase content increases the brittle tendency of the weld, which also means a reduction in its impact toughness. In addition, a longer thermal exposure leads to the transformation of ferrite δ into a brittle phase σ, which deteriorates the mechanical properties of the steel [1]. Maintaining the appropriate content of the discussed phase, as well as the possibility of estimating the content, especially with suspected exposure of the construction material to elevated temperatures, is useful for assessments of mechanical properties of the material. The described collection contains the results of topographic imaging and potential mapping of the surface of AISI 317L samples. The aim of the research was to confirm the possibility of observing phase heterogeneity based on the diversified morphology and volta potential values. Measurements were made in the semi-contact imaging mode, synchronously with potential mapping using Kelvin probe microscopy. A conductive, semi-contact CDT-NCHR probe was used. The collection contains 12 images.
- Published
- 2021
- Full Text
- View/download PDF
36. Direct Observation of Surface Potential Distribution in Insulation Resistance Degraded Acceptor-Doped BaTiO3 Multilayered Ceramic Capacitors
- Author
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Hong, Kootak, Lee, Tae Hyung, Suh, Jun Min, Park, Jae-Sung, Kwon, Hyung-Soon, Choi, Jaeho, and Jang, Ho Won
- Published
- 2018
- Full Text
- View/download PDF
37. Strain-Work Function Relationship in Single-Crystal Tetracene
- Author
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Guichuan Yu, Zuoti Xie, C. Daniel Frisbie, Javier Garcia-Barriocanal, and Zhuoran Zhang
- Subjects
Materials science ,Strain (chemistry) ,business.industry ,education ,technology, industry, and agriculture ,Scanning kelvin probe microscopy ,02 engineering and technology ,equipment and supplies ,010402 general chemistry ,021001 nanoscience & nanotechnology ,01 natural sciences ,0104 chemical sciences ,Organic semiconductor ,chemistry.chemical_compound ,Tetracene ,chemistry ,Optoelectronics ,General Materials Science ,Work function ,sense organs ,Electronics ,skin and connective tissue diseases ,0210 nano-technology ,business ,Single crystal - Abstract
Understanding the impact of strain on organic semiconductors is important for the development of electronic devices and sensors that are subject to environmental changes and mechanical stimuli; it is also important for understanding the fundamental mechanisms of charge trapping. Following our previous study on the strain effects in rubrene, we present here only the second example of the strain-work function relationship in an organic semiconductor; in this case, the benchmark material tetracene. Thin, platelike single crystals of tetracene with large (001) facets were laminated onto silicon and rubber substrates having significantly different coefficients of thermal expansion; mechanical strain in tetracene was subsequently induced by varying the temperature of the assembly. Tensile and compressive strains parallel to the (001) major facet were measured by grazing incidence X-ray diffraction, and the corresponding shifts in the electronic work functions were recorded via scanning Kelvin probe microscopy (SKPM). The work function of the tetracene (001) crystal surface directly correlated with the net mechanical strain and increased by ∼100 meV for in-plane tensile strains of 0.1% and decreased by approximately the same amount for in-plane compressive strains of -0.1%. This work provides evidence of the general and important impact of strain on the electrical properties of van der Waals bonded crystalline organic semiconductors and thereby supports the hypothesis that heterogeneous strains, for example in thin films, can be a major source of static electronic disorder.
- Published
- 2020
38. Investigating the effect of nanoscale triboelectrification on nanofriction in insulators
- Author
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Yitian Peng, Xuehui Gan, Haojie Lang, Chi Zhang, Kun Zou, Tianzhao Bu, and Bin Shi
- Subjects
Materials science ,Renewable Energy, Sustainability and the Environment ,Atomic force microscopy ,Electric field ,General Materials Science ,Nanotechnology ,Scanning kelvin probe microscopy ,Electrical and Electronic Engineering ,Dissipation ,Electrostatics ,Nanoscopic scale ,Triboelectric effect - Abstract
Nanofriction and nanoscale triboelectrification is a universally existing phenomenon and important in many branches of nanotechnology, but how the nanoscale triboelectrification affects the nanofriction during the relative sliding at the contact interface is not fully investigated. Here, nanoscale triboelectrification and nanofriction on the insulating SiO2 surface were investigated with atomic force microscopy (AFM) and scanning Kelvin probe microscopy. By the AFM tip sliding on the SiO2 surface, both triboelectric charges and nanofriction were investigated with the applied load, sliding cycle, and external electric field. Whether the tribocharges on the SiO2 surface were negative or positive, the nanofriction increases with the enhanced tribocharge density by nanoscale triboelectrification, while decreases with the reduced tribocharges by charge diffusion. The change of nanofriction correlates strongly with the variation in tribocharge density due to the tribocharge induced excess electrostatic interactions at the sliding interface. These findings not only add to our understanding of the role of nanoscale triboelectrification on nanofriction, but also help to control energy dissipation of sliding nanofriction, which is also important in many branches of nanotechnology, such as data storage and nanoelectromechanical system.
- Published
- 2022
- Full Text
- View/download PDF
39. Investigation of Contact Potential Variation in Amorphous Silicon Module Interface by Scanning Kelvin Probe Microscopy
- Author
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G. O. Osayemwenre, R. T. Taziwa, and E. L. Meyer
- Subjects
Amorphous silicon ,chemistry.chemical_compound ,Materials science ,chemistry ,business.industry ,Interface (computing) ,Optoelectronics ,Scanning kelvin probe microscopy ,General Medicine ,business - Published
- 2018
- Full Text
- View/download PDF
40. Analysis of Surface Potential of Copper-Modified Reduced Graphene Oxide Using Scanning Kelvin Probe Microscopy
- Author
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Jyoti Shakya and Tanuja Mohanty
- Subjects
Surface (mathematics) ,chemistry.chemical_compound ,Materials science ,Chemical engineering ,chemistry ,Graphene ,law ,Oxide ,chemistry.chemical_element ,Scanning kelvin probe microscopy ,General Medicine ,Copper ,law.invention - Published
- 2018
- Full Text
- View/download PDF
41. The Importance of Contact Resistance in High-Mobility Organic Field-Effect Transistors Studied by Scanning Kelvin Probe Microscopy
- Author
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Guodong Li, Zhuojun Chen, and Yuanyuan Hu
- Subjects
Materials science ,business.industry ,Transistor ,Contact resistance ,Benzothiophene ,Scanning kelvin probe microscopy ,02 engineering and technology ,Atmospheric temperature range ,010402 general chemistry ,021001 nanoscience & nanotechnology ,01 natural sciences ,Temperature measurement ,0104 chemical sciences ,Electronic, Optical and Magnetic Materials ,law.invention ,chemistry.chemical_compound ,chemistry ,law ,Optoelectronics ,Field-effect transistor ,Overall performance ,Electrical and Electronic Engineering ,0210 nano-technology ,business - Abstract
Contact resistance effect is a major issue in organic field-effect transistors (OFETs) because it can severely limit or even dominate the overall performance of OFETs. This is especially true for recently developed high-mobility OFETs. Here, we present a systematic study of the contact resistance and its effect on mobility in high-mobility 2,7-dioctyl[1]benzothieno[3,2-b][1]benzothiophene (C8-BTBT) OFETs by scanning Kelvin probe microscopy. We find that the contact resistance effect can lower the mobility by a factor of four at some temperatures. More interestingly, it is seen that the contact resistance has significant influence on the temperature dependent mobility behavior. The contact resistance-corrected mobility demonstrates stronger band-like transport than the uncorrected mobility in the same temperature range, which has not been reported before.
- Published
- 2018
- Full Text
- View/download PDF
42. Doping of TIPS-pentacene via Focused Ion Beam (FIB) exposure.
- Author
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Saive, Rebecca, Mueller, Lars, Mankel, Eric, Kowalsky, Wolfgang, and Kroeger, Michael
- Subjects
- *
SEMICONDUCTOR doping , *ELECTRIC conductivity , *FOCUSED ion beams , *ELECTRON mobility , *THRESHOLD voltage , *ORGANIC electronics - Abstract
Highlights: [•] We observed an influence of Ga+ Focused Ion Beam (FIB) exposure on TIPS-pentacene. [•] Mobility and conductivity increase significantly, threshold voltage decreases. [•] XPS analysis shows a clear Ga signature and an evidence for p-doping. [•] SKPM data show local p-doping and local conductivity increase. [•] An application can be local doping and nanopatterned contacts in organic devices [ABSTRACT FROM AUTHOR]
- Published
- 2013
- Full Text
- View/download PDF
43. Water-Gated Charge Doping of Graphene Induced by Mica Substrates.
- Author
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Shim, Jihye, Lui, Chun Hung, Ko, Taeg Yeoung, Yu, Young-Jun, Kim, Philip, Heinz, Tony F., and Ryu, Sunmin
- Published
- 2012
- Full Text
- View/download PDF
44. Bimolecular recombination in ambipolar organic field effect transistors
- Author
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Charrier, D.S.H., Vries, T. de, Mathijssen, S.G.J., Geluk, E.-J., Smits, E.C.P., Kemerink, M., and Janssen, R.A.J.
- Subjects
- *
FIELD-effect transistors , *ORGANIC electronics , *RECOMBINATION in semiconductors , *SCANNING probe microscopy , *SURFACES (Technology) , *TRANSFER functions - Abstract
Abstract: In ambipolar organic field effect transistors (OFET) the shape of the channel potential is intimately related to the recombination zone width W, and hence to the electron–hole recombination strength. Experimentally, the recombination profile can be assessed by scanning Kelvin probe microscopy (SKPM). However, surface potentials as measured by SKPM are distorted due to spurious capacitive couplings. Here, we present a (de)convolution method with an experimentally calibrated transfer function to reconstruct the actual surface potential from a measured SKPM response and vice versa. Using this scheme, we find W =0.5μm for a nickel dithiolene OFET, which translates into a recombination rate that is two orders of magnitude below the value expected for Langevin recombination. [Copyright &y& Elsevier]
- Published
- 2009
- Full Text
- View/download PDF
45. Conductivity, work function, and environmental stability of PEDOT:PSS thin films treated with sorbitol
- Author
-
Nardes, A.M., Kemerink, M., de Kok, M.M., Vinken, E., Maturova, K., and Janssen, R.A.J.
- Subjects
- *
ELECTRIC properties of polymers , *CONDUCTIVITY of electrolytes , *THIN films , *ELECTRON work function , *SORBITOL , *DISPERSION (Chemistry) , *HYDROGEN-ion concentration - Abstract
Abstract: The electrical properties of poly(3,4-ethylenedioxythiophene):poly(4-styrenesulfonate) (PEDOT:PSS) thin films deposited from aqueous dispersion using different concentrations of sorbitol have been studied in detail. Although it is well known that sorbitol enhances the conductivity of PEDOT:PSS thin films by three orders of magnitude, the origin and consequences of sorbitol treatment are only partly understood and subject of further study. By thermal annealing of spin coated PEDOT:PSS/sorbitol films and simultaneously monitoring the conductivity, we demonstrate that the strong increase in conductivity coincides with evaporation of sorbitol from the film. Hence, sorbitol is a processing additive rather than a (secondary) dopant. Scanning Kelvin probe microscopy reveals that sorbitol treatment causes a reduction of the work function from 5.1eV to 4.8–4.9eV. Sorbitol also influences the environmental stability of the films. While the conductivity of the pristine PEDOT:PSS films increases by about one order of magnitude at ∼50% RH due to an ionic contribution to the overall conductivity, films prepared using sorbitol exhibit an increased environmental stability with an almost constant conductivity up to 45% RH and a slight decrease at 50% RH. The higher stability results from a reduced tendency to take up water from the air, which is attributed to a denser packing of the PEDOT:PSS after sorbitol treatment. [Copyright &y& Elsevier]
- Published
- 2008
- Full Text
- View/download PDF
46. Uniform Surface Characteristics in Sequentially Polymerized Polyurea Films
- Author
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Hyein Kim, Ui-Jin Choi, Jin Seok Lee, and Yi-Seul Park
- Subjects
Surface (mathematics) ,Materials science ,Scanning kelvin probe microscopy ,02 engineering and technology ,General Chemistry ,010402 general chemistry ,021001 nanoscience & nanotechnology ,01 natural sciences ,0104 chemical sciences ,chemistry.chemical_compound ,Polymerization ,chemistry ,Molecular alignment ,Composite material ,0210 nano-technology ,Polyurea - Published
- 2017
- Full Text
- View/download PDF
47. Mapping of Work Function in Self-Assembled V2O5 Nanonet Structures
- Author
-
Jeong Woo Park and Taekyeong Kim
- Subjects
symbols.namesake ,Materials science ,Condensed matter physics ,Chemistry (miscellaneous) ,Fermi level ,symbols ,Chemical Engineering (miscellaneous) ,Work function ,Scanning kelvin probe microscopy ,Volta potential ,Self assembled - Published
- 2017
- Full Text
- View/download PDF
48. Low-Temperature Processed TiOx/Zn1−xCdxS Nanocomposite for Efficient MAPbIxCl1−x Perovskite and PCDTBT:PC70BM Polymer Solar Cells
- Author
-
Tanyakorn Muangnapoh, Narong Chanlek, Pisist Kumnorkaew, David A. Lewis, Khathawut Lohawet, Binh Duong, Anirudh Sharma, and Hideki Nakajima
- Subjects
Materials science ,Polymers and Plastics ,polymer ,electron transport layer ,Homogeneous distribution ,Polymer solar cell ,Article ,lcsh:QD241-441 ,lcsh:Organic chemistry ,Surface charge ,Thin film ,scanning Kelvin probe microscopy ,TiOx ,perovskite ,Perovskite (structure) ,chemistry.chemical_classification ,ZnCdS ,Nanocomposite ,business.industry ,General Chemistry ,Polymer ,Solar cell efficiency ,chemistry ,solar cells ,Optoelectronics ,business - Abstract
The majority of high-performance perovskite and polymer solar cells consist of a TiO2 electron transport layer (ETL) processed at a high temperature (>, 450 °, C). Here, we demonstrate that low-temperature (80 °, C) ETL thin film of TiOx:Zn1&minus, xCdxS can be used as an effective ETL and its band energy can be tuned by varying the TiOx:Zn1&minus, xCdxS ratio. At the optimal ratio of 50:50 (vol%), the MAPbIxCl1&minus, x perovskite and PCBTBT:PC70BM polymer solar cells achieved 9.79% and 4.95%, respectively. Morphological and optoelectronic analyses showed that tailoring band edges and homogeneous distribution of the local surface charges could improve the solar cells efficiency by more than 2%. We proposed a plausible mechanism to rationalize the variation in morphology and band energy of the ETL.
- Published
- 2019
49. Enhancing charge transport in an organic photoactive layer via vertical component engineering for efficient perovskite/organic integrated solar cells
- Author
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Chunyan Zhao, Siqian Hu, Qiang Guo, Ahmed Alsaedi, Zhan'ao Tan, Tasawar Hayat, Yiming Bai, Chenyun Wang, and Jin Zhang
- Subjects
Materials science ,business.industry ,Infrared ,Exciton dissociation ,Kinetics ,Scanning kelvin probe microscopy ,02 engineering and technology ,Component engineering ,010402 general chemistry ,021001 nanoscience & nanotechnology ,01 natural sciences ,Acceptor ,0104 chemical sciences ,Photoactive layer ,Optoelectronics ,General Materials Science ,0210 nano-technology ,business - Abstract
Suitable vertical component distribution within an organic bulk-heterojunction (BHJ) is vital for effective exciton dissociation and smooth charge transport in perovskite/organic integrated solar cells (ISCs). Herein, a bi-continuous interpenetrating network of organic donor/acceptor materials is constructed simply by optimizing their weight ratio, and is further applied in perovskite/organic ISCs. Time-of-flight secondary-ion mass spectroscopy (TOF-SIMS) and scanning Kelvin probe microscopy (SKPM) strongly confirm that this method can effectively restrict vertical stratification and build a desired bi-continuous framework within the organic photoactive layer, which can effectively suppress two potential recombination losses from the viewpoint of kinetics, leading to the PCE increasing from 12.63% to 15.47% for ISCs based on the structure of MAPbI3/PBDB-T : IEICO. Meanwhile, our ISCs combining a UV–vis harvesting layer of MAPbI3 and a near-infrared absorbing layer of PBDB-T : IEICO exhibit a photo-response extending to the whole visible and infrared spectrum (up to 900 nm). This work verifies that tuning the donor/acceptor weight ratio is a feasible strategy for optimizing the morphology of BHJ absorbers and suppressing charge recombination for efficient perovskite/BHJ ISCs.
- Published
- 2019
50. Quantitative amplitude-modulation scanning Kelvin probe microscopy via the second eigenmode excitation.
- Author
-
Lai, Junqi, Wang, Cheng, Xing, Zhiwei, Lu, Shulong, Chen, Qi, and Chen, Liwei
- Subjects
- *
SCANNING probe microscopy , *KELVIN probe force microscopy , *GALLIUM nitride , *VIRTUAL work , *AMPLITUDE modulation , *GALLIUM arsenide - Abstract
• Reduction of cantilever crosstalk in amplitude-modulation scanning Kelvin probe microscopy. • Verification of accuracy of measurements using interdigitating electrodes calibration samples and numerical simulation. • Determination of built-in potential of wafer-bonded GaAs/GaN heterojunction using quantitative AM-SKPM. Amplitude modulation scanning Kelvin probe microscopy (AM-SKPM) is widely used to measure the contact potential difference (CPD) between probe and samples in ambient or dry inert atmosphere. However, AM-SKPM is generally considered quantitatively inaccurate due to crosstalk between the cantilever and the sample. Here we demonstrate that the accuracy of AM-SKPM-based CPD measurements is drastically improved by exciting the SKPM probe at its second eigenmode. In the second eigenmode of oscillation, there exists a stationary node at the cantilever towards its free end, across which the displacement bears opposite signs; therefore driving the SKPM probe at its second eigenmode helps to partially cancel the virtual work done by the cantilever and reduce the crosstalk effect. The improvement in accuracy is experimentally confirmed with interdigitating electrodes calibration samples as well as practical samples such as the cross-section of wafer-bonded GaAs/GaN heterojunction. [ABSTRACT FROM AUTHOR]
- Published
- 2021
- Full Text
- View/download PDF
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