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Characterization of CMOS Metamaterial Transmission Line by Compact Fractional-Order Equivalent Circuit Model.

Authors :
Yang, Chang
Yu, Hao
Shang, Yang
Fei, Wei
Source :
IEEE Transactions on Electron Devices. Sep2015, Vol. 62 Issue 9, p3012-3018. 7p.
Publication Year :
2015

Abstract

In this paper, a compact fractional-order equivalent circuit model is developed to characterize three types of metamaterial transmission lines (T-lines): 1) composite right-/left-handed transmission line T-line; 2) split ring resonator T-line; and 3) complimentary split ring resonator T-line, all designed in 65-nm CMOS process at millimeter-wave frequency region. With the consideration of frequency-dependent dispersion loss and nonquasistatic effect, the proposed fractional-order equivalent circuit model can compactly characterize the measured results with good agreement up to 325 GHz. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
62
Issue :
9
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
109065868
Full Text :
https://doi.org/10.1109/TED.2015.2458931