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Full-Chip Power Supply Noise Time-Domain Numerical Modeling and Analysis for Single and Stacked ICs.
- Source :
-
IEEE Transactions on Electron Devices . Mar2016, Vol. 63 Issue 3, p1225-1231. 7p. - Publication Year :
- 2016
-
Abstract
- In this paper, a distributed circuit model for on-die power distribution network in single and 3-D ICs is developed, and a set of difference equations are derived based on the circuit model and numerically solved using the finite-difference method. Both IR-drop and simultaneous switching noise, two components of power supply noise (PSN), are iteratively solved in time domain, thereby enabling a transient analysis of PSN. Under the assumptions that on-die power/ground pads, power density, and decoupling capacitors are uniformly distributed, PSN within a unit cell is accurately simulated with <1% error compared with HSPICE simulation. By reducing modeling grid fineness, the numerical modeling approach is applied to a full chip that has multiple blocks with nonuniform power/ground pads, power density, and decoupling capacitance density. Based on full-chip modeling, the PSN distribution of a two-die stack is simulated, and the impact of increasing decoupling capacitance and power/ground pads is investigated. [ABSTRACT FROM PUBLISHER]
Details
- Language :
- English
- ISSN :
- 00189383
- Volume :
- 63
- Issue :
- 3
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Electron Devices
- Publication Type :
- Academic Journal
- Accession number :
- 113411555
- Full Text :
- https://doi.org/10.1109/TED.2016.2521362