Back to Search Start Over

Investigation of Robustness Capability of −730 V P-Channel Vertical SiC Power MOSFET for Complementary Inverter Applications.

Authors :
An, Junjie
Namai, Masaki
Yano, Hiroshi
Iwamuro, Noriyuki
Source :
IEEE Transactions on Electron Devices. Oct2017, Vol. 64 Issue 10, p4219-4225. 7p.
Publication Year :
2017

Abstract

In this paper, a p-channel vertical 4H-silicon carbide (SiC) MOSFET (SiC p-MOSFET) has been fabricated successfully for the first time as a potential candidate for the complementary inverter application. The static characteristics and the robustness, including short circuit and avalanche capabilities of the p-MOSFET, are experimentally tested. Moreover, the comparison between the p-MOSFET and similar rating n-MOSFET is carried out. The short-circuit capability is 15% higher than that of the n-channel MOSFET. Furthermore, this paper also provides the physical insights into the failure mechanism during the short-circuit transient of the p- and n-MOSFET. Meanwhile, an electro-thermal analytical model is proposed to explain the thermal distribution during this transient. Last, the avalanche withstand time of the fabricated SiC p-MOSFET is experimentally demonstrated to be 27% higher than that of the n-channel one. It is concluded that the SiC p-MOSFET could be a competitive power switch applicable for high-frequency complementary inverters. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
00189383
Volume :
64
Issue :
10
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
125755838
Full Text :
https://doi.org/10.1109/TED.2017.2742542