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Strain-Engineered Asymmetrical Superlattice Si/Si1–xGex Nano-ATT $\langle$ p++-n-n−-n++ $\rangle$ Oscillator: Enhanced Photo-Sensitivity in Terahertz Domain.

Authors :
Chatterjee, Sulagna
Mukherjee, Moumita
Source :
IEEE Transactions on Electron Devices. Aug2019, Vol. 66 Issue 8, p3659-3667. 9p.
Publication Year :
2019

Abstract

This paper proposes a strained Si-based single drift nano-mixed tunnel avalanche transit time (MITATT) oscillator capable of generating high RF power in the terahertz regime, inaccessible by conventional Si devices. The authors have developed a quantum modified classical drift-diffusion model to study the nanoscale properties of strained Si oscillator. The study reveals that 14.72-GW/m2 RF power could be generated from 0.715-THz strain-engineered Si oscillator. Such performance enhancement of the Si device is due to selective incorporation of trace amounts of Ge in the Si active region. This generates in-plane biaxial strain which in turn degrades the in-plane electron mobility, hence unsuitable for conventional MOSFETs. However, such strain remarkably enhances the out-of-plane mobility, and uniqueness of the current research is the utilization of in-plane strain to boost up the out-of-plane mobility depending on geometry and dimensions of the oscillator’s active region. The model incorporates parasitic series resistance and elevates junction temperature effects on terahertz properties of the device. Incorporation of the strained layer in the active region reduces the parasitic series resistance effect on high frequency properties of the oscillator. Validity of the developed model is established by comparing simulated data with the corresponding experimental observations. The authors have further studied photo irradiation effects on terahertz characteristics of the new class of devices. The structure-induced quantum confinement effect has made the Si-based active region to behave as a partially direct bandgap material, and therefore, a significant improvement is observed in optical sensitivity. To the best of the authors’ knowledge, this is the first report on strain-engineered asymmetrically doped Si/SiGe based avalanche photosensor in the high-frequency terahertz domain. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
66
Issue :
8
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
138462823
Full Text :
https://doi.org/10.1109/TED.2019.2923108