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High‐quality depth up‐sampling based on multi‐scale SLIC.
- Source :
-
Electronics Letters (Wiley-Blackwell) . Apr2018, Vol. 54 Issue 7, p494-496. 3p. - Publication Year :
- 2018
-
Abstract
- A multi‐scale simple linear iterative clustering (SLIC)‐based depth up‐sampling method is proposed in order to obtain high‐quality depth maps, especially in the case of high up‐sampling rate. The proposed method is implemented hierarchically, where the high‐resolution image is segmented from coarse to fine by using multi‐scale SLIC superpixels. A depth guided discriminant function is defined to distinguish the validity of the segmented superpixels, and only the valid ones will be interpolated each layer. The experimental results show that the proposed method solves the depth missing and the depth confusion problems largely. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00135194
- Volume :
- 54
- Issue :
- 7
- Database :
- Academic Search Index
- Journal :
- Electronics Letters (Wiley-Blackwell)
- Publication Type :
- Academic Journal
- Accession number :
- 148786683
- Full Text :
- https://doi.org/10.1049/el.2017.4393