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Storage-Based Built-In Self-Test for Gate-Exhaustive Faults.
- Source :
-
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems . Oct2021, Vol. 40 Issue 10, p2189-2193. 5p. - Publication Year :
- 2021
-
Abstract
- Built-in self-test (BIST) approaches are suitable for in-field testing since they do not require a tester for storage and application of test data. They also reduce the security vulnerabilities associated with loading and unloading of external test data into scan chains. As technologies evolve, in-field testing needs to address more complex defect and aging mechanisms that require specific deterministic tests. This can be addressed by BIST approaches that store test data on-chip and use the data for on-chip generation of both random and deterministic tests. In this case, there is a tradeoff between the amount of stored test data and the comprehensiveness of the test set that can be applied. This article explores this tradeoff in a specific context that has the following main features: 1) the initial stored test data is based on a stuck-at test set; 2) the target faults are single-cycle gate-exhaustive faults; and 3) the stored test data is enhanced gradually by test data based on a gate-exhaustive test set to increase the coverage of gate-exhaustive faults. [ABSTRACT FROM AUTHOR]
- Subjects :
- *DATABASES
*LOGIC circuits
*FAULT diagnosis
Subjects
Details
- Language :
- English
- ISSN :
- 02780070
- Volume :
- 40
- Issue :
- 10
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems
- Publication Type :
- Academic Journal
- Accession number :
- 153710610
- Full Text :
- https://doi.org/10.1109/TCAD.2020.3035133