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Concerted Wire Lifting: Enabling Secure and Cost-Effective Split Manufacturing.

Authors :
Patnaik, Satwik
Ashraf, Mohammed
Li, Haocheng
Knechtel, Johann
Sinanoglu, Ozgur
Source :
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Feb2022, Vol. 41 Issue 2, p266-280. 15p.
Publication Year :
2022

Abstract

In this work, we advance the security promise of split manufacturing through judicious handling of interconnects. First, we study the cost-security tradeoffs underlying for split manufacturing, which are limiting its adoption. Next, aiming to resolve these concerns, we propose three effective and efficient strategies to dedicatedly lift nets to higher metal layers. Toward this end, we design custom “elevating cells” and devise procedures for routing blockages. All our techniques are employed in a commercial-grade computer-aided design (CAD) framework. For our security analysis, we leverage various state-of-the-art attacks (network flow-based attack, routing-congestion-aware attack, and deep learning-based attack), established metrics (correct connection rate, output error rate, and Hamming distance), and advanced metrics (percentage of netlist recovery and mutual information). Our extensive experiments show that our scheme provides superior protection. Simultaneously, we induce reasonably low and controllable overheads on power and performance, without any silicon area costs. Besides, we support higher split layers, which helps to alleviate concerns on the practicality of split manufacturing. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
02780070
Volume :
41
Issue :
2
Database :
Academic Search Index
Journal :
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems
Publication Type :
Academic Journal
Accession number :
154861850
Full Text :
https://doi.org/10.1109/TCAD.2021.3056379