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A Comprehensive Evaluation of Integrated Circuits Side-Channel Resilience Utilizing Three-Independent-Gate Silicon Nanowire Field Effect Transistors-Based Current Mode Logic.

Authors :
Liu, Yanjiang
He, Jiaji
Ma, Haocheng
Qu, Tongzhou
Dai, Zibin
Source :
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Oct2022, Vol. 41 Issue 10, p3228-3238. 11p.
Publication Year :
2022

Abstract

Side-channel attack (SCA) is one of the physical attacks, which will reveal the confidential information from cryptographic circuits by statistically analyzing physical manifestations. Various circuit-level countermeasures have been proposed as fundamental solutions to eliminate the correlations between side-channel information and circuit’s internal operations. The existing solutions, however, will introduce nonnegligible power and area overheads, making them difficult to be deployed in resource-constrained applications. In this article, a novel three-independent-gate silicon nanowire field effect transistor (TIGFET) with the intrinsic SCA-resilience characteristics is introduced to balance the tradeoffs among cost, performance, and security of cryptographic implementations. We construct six TIGFET-based current mode logic (CML) gates that can retain lower power variation under all possible transitions compared to the CMOS counterparts. As a proof of concept, advanced encryption standard (AES), SM4 block cipher algorithm (SM4), and lightweight cryptographic algorithm PRESENT are implemented utilizing the TIGFET-based CML gates. Correlation power attack is performed to evaluate the improvement of SCA resilience. Simulation results verify that the TIGFET-based cryptographic implementations decrease 42.37% area usage, lower 61.16% energy efficiency, reduce $5.35\times $ power variation, and achieve a similar level of SCA resistance compared to the CMOS counterpart, which is applicable for the resource-constrained applications. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
02780070
Volume :
41
Issue :
10
Database :
Academic Search Index
Journal :
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems
Publication Type :
Academic Journal
Accession number :
160651752
Full Text :
https://doi.org/10.1109/TCAD.2021.3128364