Back to Search
Start Over
Measuring interface strains at the atomic resolution in depth using x-ray Bragg-surface diffraction.
- Source :
-
Applied Physics Letters . 8/28/2006, Vol. 89 Issue 9, p091915. 3p. 2 Diagrams, 1 Graph. - Publication Year :
- 2006
-
Abstract
- A generic x-ray diffraction method, using three-wave Bragg-surface diffraction, is developed to measure strains at the interface of molecular beam epitaxial Au/GaAs(001), where grazing-incidence diffraction cannot be applied due to the difference in refractive index between Au and GaAs. Changes in diffraction images of the surface reflection (1-13) of GaAs(006)/(1-13) three-wave Bragg-surface diffraction and the (-1-13) of GaAs(006)/(-1-13) at different azimuth and Bragg angles give the depth penetration of 2 Å resolution and variations of lattice constant, -49%, -27%, and 2%, along the surface normal [001] and in-plane directions [-1-10] and [1-10] within the depths of 18, 72, and 72 Å, respectively. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 89
- Issue :
- 9
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 22344746
- Full Text :
- https://doi.org/10.1063/1.2345023