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Monolithically Integrated Enhancement/Depletion-Mode A1GaN/GaN HEMT Inverters and Ring Oscillators Using CF4 Plasma Treatment.

Authors :
Yong Cai
Zhiqun Cheng
Wilson Chak Wah Tang
Kei May Lau
Chen, Kevin J.
Source :
IEEE Transactions on Electron Devices. Sep2006, Vol. 53 Issue 9, p2223-2230. 8p. 5 Black and White Photographs, 4 Diagrams, 4 Charts, 7 Graphs.
Publication Year :
2006

Abstract

Fabrication and characterization of AlGaN/GaN HEMT inverters and ring oscillators utilizing integrated enhancement/depletion-mode (E/D-mode) AlGaN/GaN HEMTs are presented. The core technique is a CF4 plasma treatment that can effectively convert a D-mode AlGaN/GaN heterostructure to an E-mode heterostructure. A significant advantage of the plasma-treated E-mode HEMTs is that the gate current is reduced in both reverse- and forward-bias regions due to the effectively enhanced barrier height induced by the negatively charged fluorine ions in the AlGaN barrier. As a result, the input voltage swing is expanded by about 1 V for the E-mode HEMT, enabling convenient input/output logic level matching for multistage logic circuits such as ring oscillators. The fabricated 17-stage direct-coupled field-effect transistor logic ring oscillator using the 1-μm-gate technology can operate properly at a larger supply voltage of 3.5 V, and a minimum propagation delay of 130 ps/stage is achieved. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
53
Issue :
9
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
22676611
Full Text :
https://doi.org/10.1109/TED.2005.881002