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Measuring voltage transients with an ultrafast scanning tunneling microscope.
- Source :
-
Applied Physics Letters . 5/12/1997, Vol. 70 Issue 19, p2625. 3p. 2 Diagrams, 3 Graphs. - Publication Year :
- 1997
-
Abstract
- Investigates the voltage transients using an ultrafast scanning tunneling microscope. Dependence of the transient signal amplitude on the tunneling resistance; Geometrical capacitance of the tip-electrode junction; Illumination of the current-gating photoconductive switch.
- Subjects :
- *ELECTRIC transients
*SCANNING tunneling microscopy
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 70
- Issue :
- 19
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 4199202
- Full Text :
- https://doi.org/10.1063/1.118938