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Mechanism of chemical erosion of sputter-deposited C:H films.

Authors :
Schenk, A.
Biener, J.
Source :
Applied Physics Letters. 11/16/1992, Vol. 61 Issue 20, p2414. 3p. 3 Graphs.
Publication Year :
1992

Abstract

Investigates the mechanism of thermally activated chemical erosion of sputter-deposited carbon:hydrogen (C:H) films. Desorption of methane as gaseous products; Determination of C-CH bond breaking as rate limiting step of hydrocarbon production; Occurrence of CH[sub 3] radical desorption from the surface of the C:H films.

Details

Language :
English
ISSN :
00036951
Volume :
61
Issue :
20
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
4240794
Full Text :
https://doi.org/10.1063/1.108182