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Failure mechanism of GTO devices and optimization for minimum current crowding during turn-off.
- Source :
-
International Journal of Electronics . Dec94, Vol. 77 Issue 6, p869. 18p. - Publication Year :
- 1994
-
Abstract
- Discusses the failure mechanism of GTO thyristors and optimization for minimum current crowding during turn-off. Qualitative optimization of internal parameters through detailed two-dimensional device simulations to minimize the current crowding; Influence of the current crowding phenomenon on the maximum controllable anode current.
- Subjects :
- *THYRISTORS
*ELECTRIC currents
*MATHEMATICAL optimization
Subjects
Details
- Language :
- English
- ISSN :
- 00207217
- Volume :
- 77
- Issue :
- 6
- Database :
- Academic Search Index
- Journal :
- International Journal of Electronics
- Publication Type :
- Academic Journal
- Accession number :
- 6578804
- Full Text :
- https://doi.org/10.1080/00207219408926107