Noncontact minority-carrier lifetime measurement for magnetic field applied Czochralski silicon crystals.

Presents a study that measured minority-carrier recombination lifetime with a noncontact laser/microwave method for magnetic field applied Czochralski silicon crystals. Lifetime behavior in both as-grown and heat treated silicon crystals; Use of conventional infrared absorption spectroscopy or transmission electron microscopy; Correlation between lifetime and initial oxygen concentration for the samples.