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Reaction kinetics in silicon chemical vapor deposition

Authors :
Tonokura, Kenichi
Koshi, Mitsuo
Source :
Current Opinion in Solid State & Materials Science. Oct2002, Vol. 6 Issue 5, p479. 7p.
Publication Year :
2002

Abstract

Gas-phase reactions of simple silicon hydride species underlying many types of chemical vapor deposition processes for silicon-based thin-film growth are reviewed in this paper. Mass spectrometry and laser-based spectroscopy are applied to identify gas-phase intermediates in thermal and hot-wire chemical vapor deposition processes. The mechanism of the thermal decomposition of silanes, including reactions that lead to the formation of hydrogenated silicon clusters, is examined. The gas-phase chemical kinetic mechanism in hot-wire chemical vapor deposition is proposed to explain precursor molecules for the film growth. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
13590286
Volume :
6
Issue :
5
Database :
Academic Search Index
Journal :
Current Opinion in Solid State & Materials Science
Publication Type :
Academic Journal
Accession number :
8578815
Full Text :
https://doi.org/10.1016/S1359-0286(02)00078-5