Back to Search
Start Over
Ultra low-K shrinkage behavior when under electron beam in a scanning electron microscope.
- Source :
-
Journal of Applied Physics . Aug2013, Vol. 114 Issue 8, p084508. 6p. 3 Color Photographs, 1 Black and White Photograph, 5 Graphs. - Publication Year :
- 2013
-
Abstract
- In this paper, we investigate the tendency of porous low-K dielectrics (also named Ultra Low-K, ULK) behavior to shrink when exposed to the electron beam of a scanning electron microscope. Various experimental electron beam conditions have been used for irradiating ULK thin films, and the resulting shrinkage has been measured through use of an atomic force microscope tool. We report the shrinkage to be a fast, cumulative, and dose dependent effect. Correlation of the shrinkage with incident electron beam energy loss has also been evidenced. The chemical modification of the ULK films within the interaction volume has been demonstrated, with a densification of the layer and a loss of carbon and hydrogen elements being observed. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 114
- Issue :
- 8
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 90049047
- Full Text :
- https://doi.org/10.1063/1.4819890