Comparison of bulk built-in current sensors in terms of transient-fault detection sensitivity.

Details

Language :

English

ISBNs :

9781479953998

Database :

Complementary Index

Journal :

2014 5th European Workshop on CMOS Variability (VARI)

Publication Type :

Conference

Accession number :

101234375

Full Text :

https://doi.org/10.1109/VARI.2014.6957089