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Comparison of bulk built-in current sensors in terms of transient-fault detection sensitivity.
- Source :
- 2014 5th European Workshop on CMOS Variability (VARI); 2014, p1-6, 6p
- Publication Year :
- 2014
Details
- Language :
- English
- ISBNs :
- 9781479953998
- Database :
- Complementary Index
- Journal :
- 2014 5th European Workshop on CMOS Variability (VARI)
- Publication Type :
- Conference
- Accession number :
- 101234375
- Full Text :
- https://doi.org/10.1109/VARI.2014.6957089