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A 1.4 pJ/bit, Power-Scalable 16×12 Gb/s Source-Synchronous I/O With DFE Receiver in 32 nm SOI CMOS Technology.

Authors :
Dickson, Timothy O.
Liu, Yong
Rylov, Sergey V.
Agrawal, Ankur
Kim, Seongwon
Hsieh, Ping-Hsuan
Bulzacchelli, John F.
Ferriss, Mark
Ainspan, Herschel A.
Rylyakov, Alexander
Parker, Benjamin D.
Beakes, Michael P.
Baks, Christian
Shan, Lei
Kwark, Young
Tierno, Jose A.
Friedman, Daniel J.
Source :
IEEE Journal of Solid-State Circuits; Aug2015, Vol. 50 Issue 8, p1917-1931, 15p
Publication Year :
2015

Abstract

A power-scalable 2 Byte I/O operating at 12 Gb/s per lane is reported. The source-synchronous I/O includes controllable TX driver amplitude, flexible RX equalization, and multiple deskew modes. This allows power reduction when operating over low-loss, low-skew interconnects, while at the same time supporting higher-loss channels without loss of bandwidth. Transceiver circuit innovations are described including a low-skew transmission-line clock distribution, a 4:1 serializer with quadrature quarter-rate clocks, and a phase rotator based on current-integrating phase interpolators. Measurements of a test chip fabricated in 32 nm SOI CMOS technology demonstrate 1.4 pJ/b efficiency over 0.75” Megtron-6 PCB traces, and 1.9 pJ/b efficiency over 20” Megtron-6 PCB traces. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
00189200
Volume :
50
Issue :
8
Database :
Complementary Index
Journal :
IEEE Journal of Solid-State Circuits
Publication Type :
Academic Journal
Accession number :
108597472
Full Text :
https://doi.org/10.1109/JSSC.2015.2412688