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3D heterogeneous integration structure based on 40 nm- and 0.18 µm-technology nodes.

Authors :
Hu, Yu-Chen
Lin, Chun-Pin
Hsieh, Yu-Sheng
Chang, Nien-Shyang
Gallegos, Anthony J.
Souza, Terry
Chen, Wei-Chia
Sheu, Ming-Hwa
Chang, Chien-Chi
Chen, Chi-Shi
Chen, Kuan-Neng
Source :
2015 IEEE 65th Electronic Components & Technology Conference (ECTC); 2015, p1646-1651, 6p
Publication Year :
2015

Details

Language :
English
ISBNs :
9781479986095
Database :
Complementary Index
Journal :
2015 IEEE 65th Electronic Components & Technology Conference (ECTC)
Publication Type :
Conference
Accession number :
108854195
Full Text :
https://doi.org/10.1109/ECTC.2015.7159817