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The effect of gate drive topology on online silicon carbide MOSFET junction temperature sensing.

Authors :
Niu, He
Lorenz, Robert D.
Source :
2015 European Conference on Circuit Theory & Design (ECCTD); 2015, p7015-7022, 8p
Publication Year :
2015

Details

Language :
English
ISBNs :
9781479998777
Database :
Complementary Index
Journal :
2015 European Conference on Circuit Theory & Design (ECCTD)
Publication Type :
Conference
Accession number :
111130215
Full Text :
https://doi.org/10.1109/ECCE.2015.7310642