Performance Testing of the Triple Modular Redundancy Mitigation Circuit Test Environment Implementation in Field Programmable Gate Array Structures.

The logic structures implemented in Field Programmable Gate Arrays (FPGAs) are often critical and their correct operation is vital. FPGA devices are often used in areas where there is increased ionising radiation (space, medical diagnostics, aviation or nuclear power). There is therefore a need for mechanisms to correct radiation-induced errors. A common approach is the redundant implementation of particularly critical parts of the logic structure. By triplicating selected fragments, it is possible not only to detect potential errors but also to correct them. Such an approach is called triple modular redundancy (TMR), and its essence lies in the use of specialised voting circuits called voters, which allow the erroneous results of individual subcircuits to be eliminated by voting. The triplicate circuit under consideration, together with the voter, constitutes the mitigation structure. It becomes necessary to develop a test environment to assess the correct operation of these circuits. Also key is the efficiency of the implementation of these structures, which can be related to the occupation of logical resources or the power consumption of a given implementation. This paper demonstrates the essence of implementing a test environment to test the correctness of the mitigation of logic structures using TMR voters. An error injector mechanism using the Pseudo-Random Bit Sequence (PRBS) register is proposed, which introduces an element of randomness into the testing process. The aim of this research is to determine the implementation efficiency of the proposed test environment. In the experimental part, the implementation costs of the proposed solution were examined. The results indicate that between 66 and 109 LUT blocks were required to implement the error injector, corresponding to a relatively small increase in dynamic power consumption: by 22% for combinational circuits and by 37% for sequential circuits. [ABSTRACT FROM AUTHOR]