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Fabrication of 0.2 μm large scale integrated circuits using synchrotron radiation x-ray lithography.

Authors :
Deguchi, K.
Miyoshi, K.
Ban, H.
Matsuda, T.
Ohno, T.
Kado, Y.
Source :
Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1995, Vol. 13 Issue 6, p3040-3045, 6p
Publication Year :
1995

Details

Language :
English
ISSN :
10711023
Volume :
13
Issue :
6
Database :
Complementary Index
Journal :
Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures
Publication Type :
Academic Journal
Accession number :
74341237
Full Text :
https://doi.org/10.1116/1.588318