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Redundant core testing on the cell BE microprocessor.

Authors :
Iverson, D.
Dickinson, D.
Masson, J.
Newman-LaBounty, C.
Simmons, D.
Tanona, W.
Source :
2010 IEEE International Test Conference (ITC); 2010, p1-6, 6p
Publication Year :
2010

Details

Language :
English
ISBNs :
9781424472062
Database :
Complementary Index
Journal :
2010 IEEE International Test Conference (ITC)
Publication Type :
Conference
Accession number :
81501750
Full Text :
https://doi.org/10.1109/TEST.2010.5699206
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