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Implementation of In-Line TDDB Testing for Gate Oxide Reliability Improvement.
- Source :
- International Integrated Reliability Workshop Final Report; 1993, p68-78, 11p
- Publication Year :
- 1993
Details
- Language :
- English
- Database :
- Complementary Index
- Journal :
- International Integrated Reliability Workshop Final Report
- Publication Type :
- Conference
- Accession number :
- 92189068
- Full Text :
- https://doi.org/10.1109/IRWS.1993.666294