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A 23-ns 256 K EPROM with double-layer metal and address transition detection.
- Source :
- IEEE Journal of Solid-State Circuits; 1989, Vol. 24 Issue 5, p1250-1258, 9p
- Publication Year :
- 1989
Details
- Language :
- English
- ISSN :
- 00189200
- Volume :
- 24
- Issue :
- 5
- Database :
- Complementary Index
- Journal :
- IEEE Journal of Solid-State Circuits
- Publication Type :
- Academic Journal
- Accession number :
- 92812242
- Full Text :
- https://doi.org/10.1109/JSSC.1989.572589