Back to Search Start Over

GeSn Technology: Impact of Sn on Ge CMOS Applications

Authors :
Shigeaki Zaima
Osamu Nakatsuka
Yosuke Shimura
Shotaro Takeuchi
Benjamin Vincent
Federica Gencarelli
Trudy Clarysse
Jelle Demeulemeester
Kristiaan Temst
Andre Vantomme
Matty Caymax
Roger Loo
Source :
ECS Meeting Abstracts. :2132-2132
Publication Year :
2011
Publisher :
The Electrochemical Society, 2011.

Abstract

not Available.

Details

ISSN :
21512043
Database :
OpenAIRE
Journal :
ECS Meeting Abstracts
Accession number :
edsair.doi...........0e9a6cc67467cd6232614d046f4d0e3f
Full Text :
https://doi.org/10.1149/ma2011-02/32/2132