Review—Carrier Lifetime Spectroscopy for Defect Characterization in Semiconductor Materials and Devices

Authors :: Jan Vanhellemont
Eddy Simoen
Eugenijus Gaubas
Source :: ECS Journal of Solid State Science and Technology. 5:P3108-P3137
Publication Year :: 2016
Publisher :: The Electrochemical Society, 2016.

Subjects :: 010302 applied physics
Materials science
business.industry
Semiconductor materials
02 engineering and technology
Carrier lifetime
021001 nanoscience & nanotechnology
01 natural sciences
Electronic, Optical and Magnetic Materials
Characterization (materials science)
Oxygen precipitation
0103 physical sciences
Optoelectronics
0210 nano-technology
business
Spectroscopy

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