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Measuring Techniques for the Semiconductor’s Parameters

Authors :
Alessandra Alberti
Filippo Giannazzo
Francesco La Via
Salvatore Lombardo
Antonio M. Mio
Giuseppe Nicotra
Stefania M. S. Privitera
Riccardo Reitano
Fabrizio Roccaforte
Corrado Spinella
Emanuele Rimini
Source :
Springer Handbook of Semiconductor Devices ISBN: 9783030798260
Publication Year :
2022
Publisher :
Springer International Publishing, 2022.

Details

ISBN :
978-3-030-79826-0
ISBNs :
9783030798260
Database :
OpenAIRE
Journal :
Springer Handbook of Semiconductor Devices ISBN: 9783030798260
Accession number :
edsair.doi...........487587941d4f5b542da9f1eee403d236
Full Text :
https://doi.org/10.1007/978-3-030-79827-7_4
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