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Preparation and characterization of ultrasonic electrodeposited copper coating

Authors :
Ronghong Cui
Jinqiang Du
Zhi Ming Yu
Wenjun Shu
Yuting He
Source :
2010 11th International Conference on Electronic Packaging Technology & High Density Packaging.
Publication Year :
2010
Publisher :
IEEE, 2010.

Abstract

Copper has replaced aluminum as the main interconnect material in VLSI, due to its low resistivity and high electromigration resistance. The property of copper coating is a key factor that determines the reliability of interconnects. A special copper coating was prepared by ultrasonic-electrodeposition method in this study, and the microstructure, hardness, wear resistance, adhesion and corrosion resistance of it were investigated respectively. Test results show that the crystallite size of it is obviously smaller than that of the ordinary electrodeposited copper coating, and the hardness, wear resistance, adhesion and corrosion resistance of it are all evidently enhanced.

Details

Database :
OpenAIRE
Journal :
2010 11th International Conference on Electronic Packaging Technology & High Density Packaging
Accession number :
edsair.doi...........4bbb55eee55a9d59c7b32688d8a97d33
Full Text :
https://doi.org/10.1109/icept.2010.5582413