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Rapid-thermal annealing for quantum-well heterostructure device fabrication

Authors :
Abhaya K. Datye
L. R. Dawson
Gregory A. Vawter
I. J. Fritz
David R. Myers
T.J. Drummond
D. S. Simons
J. Comas
Eric D. Jones
Thomas M. Brennan
Thomas E. Zipperian
B. E. Hammons
Source :
IEEE Transactions on Electron Devices. 39:41-49
Publication Year :
1992
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 1992.

Abstract

The authors examine ion implantation and rapid-thermal processing for the fabrication of quantum-well, compound-semiconductor heterostructure devices in strained and in lattice-matched material systems. The authors demonstrate improvements to the performance of two classes of devices that would be particularly sensitive to process-induced defects: p-channel strained-quantum-well field-effect transistors and single-quantum-well diode lasers. The authors correlated the device results with secondary-ion mass spectroscopy, Hall-effect, transmission-electron microscopy, and photoluminescence. >

Details

ISSN :
00189383
Volume :
39
Database :
OpenAIRE
Journal :
IEEE Transactions on Electron Devices
Accession number :
edsair.doi...........7c7c28a34c8f81c06abb2826502f0ace