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Ellipsometry and x-ray reflectometry characterization of self-assembly process of polystyrenesulfonate and polyallylamine
- Source :
- Colloid & Polymer Science. 272:1317-1321
- Publication Year :
- 1994
- Publisher :
- Springer Science and Business Media LLC, 1994.
-
Abstract
- Self-assembly of polyelectrolytes-polystyrenesulfonate (PSS) and polyallylamine (PAH) with added salts of MnCl and NaBr was studied by x-ray reflectometry and ellipsometry technique. The thickness of PSS-PAH bilayer was measured to be 5.1±0.2 nm according to reflectometry and 6.1±0.7 nm according to ellipsometry. The discrepancy in data is attributed to the difference in the interaction of the interfaces with x-rays and visible light. The films are found to be rather homogeneous and the deposition process regular. The refraction indices of the deposited films were found to ben0=1.50±0.05,k0=0.07±0.05,ne=1.53±0.05ke=0, optical axis being perpendicular to the surface. The values of refractivity characterize the whole film (up to seven bilayers) and do not vary with increasing thickness.
Details
- ISSN :
- 14351536 and 0303402X
- Volume :
- 272
- Database :
- OpenAIRE
- Journal :
- Colloid & Polymer Science
- Accession number :
- edsair.doi...........8f792960ea6252a8cef3e0d21b73ea4e