Gate oxide Reliability assessment optimization

Authors :: Frederic Monsieur
Gerard Ghibaudo
Emmanuel Vincent
G. Pananakakis
David Roy
Sylvie Bruyere
Source :: Microelectronics Reliability. 42:1505-1508
Publication Year :: 2002
Publisher :: Elsevier BV, 2002.

Subjects :: Computer science
Gate oxide
Intra-rater reliability
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Reliability (statistics)
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Reliability engineering

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