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Plasma-Enhanced Atomic-Layer Deposition of Nanometer-Thick SiNx Films Using Trichlorodisilane for Etch-Resistant Coatings

Authors :
Dan N. Le
Jinho Ahn
Byung Keun Hwang
Xiaobing Zhou
Lance Lee
Yong Chan Jung
Jiyoung Kim
Harrison Sejoon Kim
Akshay Sahota
Arul Vigneswar Ravichandran
Si Joon Kim
Jaebeom Lee
Su Min Hwang
Source :
ACS Applied Nano Materials. 4:2558-2564
Publication Year :
2021
Publisher :
American Chemical Society (ACS), 2021.

Abstract

In recent times, the requirements have become extremely stringent for employing silicon nitride (SiNx) films in various types of applications. For instance, high etch resistance coating is required...

Details

ISSN :
25740970
Volume :
4
Database :
OpenAIRE
Journal :
ACS Applied Nano Materials
Accession number :
edsair.doi...........eb5391f4ee58adf1e60a4537f6199180
Full Text :
https://doi.org/10.1021/acsanm.0c03203