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Failure Analysis of 65nm CMOS Integrated Nanoscale ReRAM Devices on a 300mm Wafer Platform
- Source :
- 2022 IEEE International Integrated Reliability Workshop (IIRW).
- Publication Year :
- 2022
- Publisher :
- IEEE, 2022.
Details
- Database :
- OpenAIRE
- Journal :
- 2022 IEEE International Integrated Reliability Workshop (IIRW)
- Accession number :
- edsair.doi...........f76dc66a14ce82a98a07b62e1d0accad
- Full Text :
- https://doi.org/10.1109/iirw56459.2022.10032747