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On the use of atomic force microscopy for structural mapping of metallic-glass thin films
- Source :
- Intermetallics, Intermetallics, Elsevier, 2014, 44, pp.121-127. ⟨10.1016/j.intermet.2013.09.006⟩
- Publication Year :
- 2014
- Publisher :
- HAL CCSD, 2014.
-
Abstract
- International audience; In this article, we discuss the recent use of the high-resolution dynamic atomic force microscopy (DAFM) in mapping the nano-scale dynamical structural heterogeneity in thin film metallic-glasses (TFMGs). Our focus is laid on the major factors which can influence the structural contrast in the DAFM images, such as tip radius, free-amplitude, set-point amplitude and surface roughness. Finally, through a comparative study of different TFMGs and single-crystal silicon, we demonstrate that the DAFM technique is effective in distinguishing different nanostructures through their energy dissipation spectra.
- Subjects :
- Amorphous metal
Materials science
Nanostructure
Silicon
business.industry
Mechanical Engineering
Metals and Alloys
chemistry.chemical_element
Nanotechnology
General Chemistry
Radius
Conductive atomic force microscopy
[CHIM.MATE]Chemical Sciences/Material chemistry
Dissipation
chemistry
Mechanics of Materials
Materials Chemistry
Surface roughness
Optoelectronics
Thin film
business
Subjects
Details
- Language :
- English
- ISSN :
- 09669795
- Database :
- OpenAIRE
- Journal :
- Intermetallics, Intermetallics, Elsevier, 2014, 44, pp.121-127. ⟨10.1016/j.intermet.2013.09.006⟩
- Accession number :
- edsair.doi.dedup.....141e20310a9b55c1a99706a9c90314ba