Cost-driven optimization of coverage of combined built-in self-test/automated test equipment testing

Subjects

Subjects :

Circuit designer
Integrated circuit design
Automatic testing equipment -- Design and construction
Mathematical optimization -- Analysis
Circuit design -- Analysis

Details

Language :

English

ISSN :

00189456

Volume :

56

Issue :

3

Database :

Gale General OneFile

Journal :

IEEE Transactions on Instrumentation & Measurement

Publication Type :

Academic Journal

Accession number :

edsgcl.167147664