Sine-fit versus discrete Fourier transform-based algorithms in SNR testing of waveform digitizers

Subjects

Subjects :

Fourier transformations -- Research
Digitizers -- Research
Signal to noise ratio -- Testing

Details

ISSN :

00189456

Volume :

v46

Issue :

n2

Database :

Gale General OneFile

Journal :

IEEE Transactions on Instrumentation & Measurement

Publication Type :

Academic Journal

Accession number :

edsgcl.19787928