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Thermometric quantum sensor using excited state of silicon vacancy centers in 4H-SiC devices

Thermometric quantum sensor using excited state of silicon vacancy centers in 4H-SiC devices

Authors :
M. Hoang, T.
Ishiwata, H.
Yuta, Masuyama
Yuichi, Yamazaki
Kojima, K.
S.-Y., Lee
Takeshi, Ohshima
Iwasaki, T.
Hisamoto, D.
Mutsuko, Hatano
M. Hoang, T.
Ishiwata, H.
Yuta, Masuyama
Yuichi, Yamazaki
Kojima, K.
S.-Y., Lee
Takeshi, Ohshima
Iwasaki, T.
Hisamoto, D.
Mutsuko, Hatano
Publication Year :
2021

Abstract

We characterized the excited state (ES) and the ground state (GS) of negatively charged silicon vacancy (V−Si) centers in hexagonal silicon carbide (4H-SiC) using optically detected magnetic resonance (ODMR) to realize thermometric quantum sensors. We report the observation of inverted contrast between ODMR signals of the ES and the GS and clarify the effect of energy sublevels of spin states in 4H-SiC. We confirm that ES ODMR signals of V−Si centers are dependent on the temperature with a thermal shift of 2 MHz/K on zero-field splitting (ZFS). Thus, we fabricated microscale dots of V−Si centers in a 4H-SiC p–n diode using proton beam writing and demonstrated the operation of thermometric quantum sensors by measuring the temperature change induced by an injected current. Our demonstration paves the way for the development of atomic-size thermometers inside SiC power devices for future applications.

Details

Database :
OAIster
Notes :
English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1375208554
Document Type :
Electronic Resource